Publications of Robert Schlögl

Ressler, T.; Timpe, O.; Neisius, T.; Find, J.; Dieterle, M.; Mestl, G.; Schlögl, R.: Time-resolved XAS investigations of the reduction / oxidation of MoO_3-x. Journal of Catalysis 191 (1), pp. 75 - 85 (2000)

Find, J.; Paál, Z.; Schlögl, R.; Wild, U.: An attempt to bridge the pressure and material gap with a disperse model catalyst for low-temperature alkane reforming. Catalysis Letters 65 (1-3), pp. 19 - 23 (2000)

Quirós, C.; Prieto, P.; Fernandez, A.; Elizalde, E.; Mornt, C.; Schlögl, R.; Spillecke, O.; Sanz, J. M.: Bonding and morphology study of carbon nitride films obtained by dual ion beam sputtering. Journal of Vacuum Science and Technology. A 18 (2), pp. 515 - 523 (2000)

Zemlyanov, D.; Weinberg, G.; Wild, U.; Schlögl, R.: Formation of a liquid film of AgNO₃ on a silver surface. Catalysis Letters 64 (2-4), pp. 113 - 118 (2000)

Kanzow, H.; Ding, A.; Nissen, J.; Sauer, H.; Belz, T.; Schlögl, R.: Formation of chains of graphitic nanoparticles by heating fullerene blacks covered with thin metal films. Physical Chemistry Chemical Physics 2 (12), pp. 2765 - 2771 (2000)

Lee, J. K.; Russo, V.; Melsheimer, J.; Köhler, K.; Schlögl, R.: Genesis of V⁴⁺ in heteropoly compounds Cs_xH_4-xPVMo₁₁O₄₀ during thermal treatment, rehydration and oxidation of methanol studied by EPR spectroscopy. Physical Chemistry Chemical Physics 2 (13), pp. 2977 - 2983 (2000)

Maksimova, N. I.; Roddatis, V. V.; Mestl, G.; Ledoux, M. J.; Schlögl, R.: Oxidative dehydrogenation of ethylbenzene to styrene over carbonaceaous materials. Eurasian Chemico-Technological Journal 2, pp. 231 - 236 (2000)

Schaefer, J. A.; Schlögl, R.; Stutzmann, M.: Aims and purpose of the 216th WE-Heraeus seminar. Physica Status Solidi A 177, p. 3 (2000)

Schedel-Niedrig, T.; Hävecker, M.; Knop-Gericke, A.; Schlögl, R.: Partial methanol oxidation over copper: active sites observed by means of in situ X-ray absorption spectroscopy. Physical Chemistry Chemical Physics 2 (15), pp. 3473 - 3481 (2000)

Schedel-Niedrig, T.; Neisius, T.; Böttger, I.; Kitzelmann, E.; Weinberg, G.; Demuth, D.; Schlögl, R.: Copper (sub)oxide formation: a surface sensitive characterization of model catalysts. Physical Chemistry Chemical Physics 2 (12), pp. 2407 - 2417 (2000)

Yang, J.; Mestl, G.; Herein, D.; Schlögl, R.; Find, J.: Reaction of NO with carbonaceous materials: 1. reaction and adsorption of NO on ashless carbon black. Carbon 38 (5), pp. 715 - 727 (2000)

Yang, J.; Mestl, G.; Herein, D.; Schlögl, R.; Find, J.: Reaction of NO with carbonaceous materials: 2. effect of oxygen on the reaction of NO with ashless carbon black. Carbon 38 (5), pp. 729 - 740 (2000)

Yang, J.; Sanchez-Cortezon, E.; Pfänder, N.; Wild, U.; Mestl, G.; Find, J.; Schlögl, R.: Reaction of NO with carbonaceous materials: 3. influence of the structure of carbonaceous materials on their reactivity towards NO. Carbon 38 (14), pp. 2029 - 2039 (2000)

Zemlyanov, D.; Schlögl, R.: Effect of oxygen on NO adsorption on the Ag(111) surface: evidence for a NO_3,ads species. Surface Science 470 (1-2), pp. L20 - L24 (2000)

Nagy, A. J.; Mestl, G.; Schlögl, R.: The Role of Subsurface Oxygen in the Silver-Catalyzed, Oxidative Coupling of Methane. Journal of Catalysis 188 (1), pp. 58 - 68 (1999)

Nagy, A. J.; Mestl, G.; Schlögl, R.: The role of sub-surface oxygen in the silver-catalyzed, oxidative coupling of methane. Journal of Catalysis 188 (1), pp. 58 - 68 (1999)

Jäger, C.; Henning, T.; Schlögl, R.; Spillecke, O.: Spectral properties of carbon black. Journal of Non-Crystalline Solids 258 (1-3), pp. 161 - 179 (1999)

Schlögl, R.: Wohin entwickelt sich das wissenschaftliche Informationswesen? Erfahrungen und Erkenntnisse aus der Max-Planck-Gesellschaft. Physikalische Blätter 55 (11), p. 3 (1999)

Zemlin, F.; Beckmann, E.; Charlé, K.-P.; Schatz, M.; Schlögl, R.: Solid nitrogen: electron microscopy and beam damage quantification at 4 K. Ultramicroscopy 80 (3), pp. 153 - 161 (1999)

Fischer, A.; Jentoft, F. C.; Weinberg, G.; Schlögl, R.; Niesen, T. P.; Bill, J.; Aldinger, F.; De Guire, M. R.; Ruehle, M.: Characterization of thin films containing zirconium, oxygen, and sulfur by scanning electron and atomic force microscopy. Journal of Materials Research 14 (9), pp. 3725 - 3733 (1999)