Microscopy

Microscopy

Our laboratories are equipped with instruments capable of observing chemical reactions under ultra high vacuum (UHV), atmospheric pressure, and electrochemical conditions, down to the atomic scale. Instruments listed here include those located at the FHI and in BESSY-II.

Atomic Force Microscopy (AFM)
Atomic force microscopes are available for the morphological characterization of nanostructured surfaces. Instruments coupled with other techniques (electrochemical AFM, STM) are also available. more
Scanning Electron Microscopy (SEM)
SEM allows for the high-lateral spatial resolution imaging of a diverse range of samples and materials. Powerful topological, elemental, and crystallographic analysis are available at the ISC Department. more
Scanning Tunneling Microscopy (STM)
Scanning tunneling microscopy systems allow for atomic level imaging of the structural and electronic properties of surfaces under different environmental conditions ((high temperature, near ambient pressure, and UHV). Recent advances in microscopy technology enable state-of-the-art characterization of surface reactions under operando conditions. more
The use of the TEM is shared with other departments at the FHI. more

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