![Scanning Electron Microscopes (SEM) Scanning Electron Microscopes (SEM)](/460824/header_image-1596722463.jpg?t=eyJ3aWR0aCI6ODQ4LCJmaWxlX2V4dGVuc2lvbiI6ImpwZyIsIm9ial9pZCI6NDYwODI0fQ%3D%3D--f1949ec4ac7cd8c638875af4611ff47e1fc3e021)
Scanning Electron Microscopes (SEM)
Thermo Scientific Apreo SEM
![SEM / Thermo Scientific Apreo SEM](/460768/original-1596722463.jpg?t=eyJ3aWR0aCI6MjQ2LCJvYmpfaWQiOjQ2MDc2OH0%3D--20a6b49846f447a508fb040ac0a7db1223e113c2)
SEM / Thermo Scientific Apreo SEM
- Source
- (FEG)
- Detectors
- Secondary Electron (SE) compound lens
- Backscattered Electron (BSE) compound lens
- UltraDry Energy Dispersive X-ray Spectroscopy (EDX)
- Electron Backscattered Diffraction (EBSD): crystallographic analysis (EBSD)
- High and Low Vacuum modes
- Low vacuum mode: 500 Pa maximum chamber pressure
- High Resolution SEM
- High Vacuum Mode: 0.7 nm
- Low Vacuum Mode: 1.2 nm
- Heating stage for in situ observation of sample changes
Hitachi S-3400N
![SEM / Hitachi S-3400N](/460806/original-1596722463.jpg?t=eyJ3aWR0aCI6MjQ2LCJvYmpfaWQiOjQ2MDgwNn0%3D--3b3f07c3b119c42a1fdc36ce1b33dd47337b6f4c)
SEM / Hitachi S-3400N
- Variable Pressure (VP) mode availalbe
- Allows microscopic characterization of wet and non-conductive samples
- High Resolution SEM
- High Vacuum Mode: 3 nm
- VP Mode: 4 nm