Scanning Electron Microscopes (SEM)

Scanning Electron Microscopes (SEM)

Thermo Scientific Apreo SEM

SEM / Thermo Scientific Apreo SEM
  • Source
    • High stability Schottky Field Emission Gun (FEG)
  • Detectors
    • Secondary Electron (SE) compound lens
    • Backscattered Electron (BSE) compound lens
    • UltraDry Energy Dispersive X-ray Spectroscopy (EDX)
    • Electron Backscattered Diffraction (EBSD): crystallographic analysis (EBSD)
  • High and Low Vacuum modes
    • Low vacuum mode: 500 Pa maximum chamber  pressure
  • High Resolution SEM
    • High Vacuum Mode: 0.7 nm
    • Low Vacuum Mode: 1.2 nm
  • Heating stage for in situ observation of sample changes

Hitachi S-3400N

SEM / Hitachi S-3400N
  • Variable Pressure (VP) mode availalbe
    • Allows microscopic characterization of wet and non-conductive samples
  • High Resolution SEM
    • High Vacuum Mode: 3 nm
    • VP Mode: 4 nm
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