Publikationen von Elmar Zeitler

Varano, C.: Elmar Zeitler: A Rigorous and Jovial Physicist: March 12, 1927–December 19, 2020. Microscopy Today 23 (3), S. 66 - 67 (2021)

Zeitler, E.: Chicago exploration days. Ultramicroscopy 123, S. 13 - 21 (2012)

Zeitler, E.: Closed Form Integral. The Mathematica Journal 9 (4), S. 698 (2005)

Reitinger, M.; Öfferlbauer, D.; Louf, P.-H.; Schattschneider, P.; Su, D. S.; Zeitler, E.: Energy loss near edge structure of sulfur in non-stoichiometric CuInS₂. Micron 32 (2), S. 141 - 146 (2001)

Su, D. S.; Neumann, W.; Hunger, R.; Schubert-Bischoff, P.; Giersig, M.; Lewerenz, H. J.; Scheer, R.; Zeitler, E.: CuAu-type ordering in epitaxial CuInS₂ films. Applied Physics Letters 73 (6), S. 785 - 787 (1998)

Fryer, J. R.; McConnell, C. H.; Dorset, D. L.; Zemlin, F.; Zeitler, E.: High resolution electron microscopy of molecular crystals. IV. Paraffins and their solid solutions. Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 453 (1964), S. 1929 - 1946 (1997)

Belz, T.; Werner, H.; Zemlin, F.; Klengler, U.; Wesemann, M.; Tesche, B.; Zeitler, E.; Reller, A.; Schlögl, R.: On the Mechanism of Fullerene Formation. Angewandte Chemie International Edition 33 (18), S. 1866 - 1869 (1994)

Uchida, Y.; Wang, N.; Zeitler, E.: The alloying effect of Ag on the reconstruction in Au (111) and (100) surfaces observed by REM. Ultramicroscopy 55 (3), S. 308 - 313 (1994)

Swiech, W.; Rastomjee, C. S.; Imbihl, R.; Evans, J.W.; Rausenberger, B.; Engel, W.; Schmid, A. K.; Bradshaw, A. M.; Zeitler, E.: On the complex structure of reaction-diffusion fronts observed during CO oxidation on Pt{100}. Surface Science 307-309 (A), S. 138 - 142 (1994)

Su, D. S.; Schattschneider, P.; Zeitler, E.: Determination of the position maximum for electron Compton scattering in electron microscopy. Physical Review B 49 (13), S. 8552 - 8556 (1994)

Su, D. S.; Swoboda, M.; Zeitler, E.: Single-electron excitation of amorphous carbon observed with energy filter. Ultramicroscopy 53 (2), S. 97 - 100 (1994)

Belz, T.; Werner, H.; Zemlin, F.; Klengler, U.; Wesemann, M.; Tesche, B.; Zeitler, E.; Reller, A.; Schlögl, R.: Zum Mechanismus der Bildung von Fullerenen. Angewandte Chemie 106 (18), S. 1919 - 1922 (1994)

Rausenberger, B.; Swiech, W.; Rastomjee, C. S.; Mundschau, M. V.; Engel, W.; Zeitler, E.; Bradshaw, A. M.: Imaging reaction-diffusion fronts with low-energy electron microscopy. Chemical Physics Letters 215 (1-3), S. 109 - 113 (1993)

Swiech, W.; Rausenberger, B.; Engel, W.; Zeitler, E.: In-situ studies of heterogeneous reactions using mirror electron microscopy. Surface Science 294 (3), S. 297 - 307 (1993)

Zeitler, E.; Su, D. S.: Background problem in electron-energy-loss spectroscopy. Physical Review B 47 (22), 14734 (1993)

Rausenberger, B.; Swiech, W.; Engel, W.; Bradshaw, A. M.; Zeitler, E.: LEEM and selected-area LEED studies of reaction front propagation. Surface Science 287/288 (1), S. 235 - 240 (1993)

Köning, J.; Boettcher, C.; Winkler, H.; Zeitler, E.; Talmon, Y.; Fuhrhop, J.-H.: Magic angle (54.7°) gradient and minimal surfaces in quadruple micellar helices. Journal of the American Chemical Society 115 (2), S. 693 - 700 (1993)

Luo, B.; Zeitler, E.: M-shell cross-sections for fast electron inelastic collisions based on photoabsorption data. Journal of Electron Spectroscopy and Related Phenomena 57 (3-4), S. 285 - 295 (1991)

Brydson, R.; Sauer, H.; Engel, W.; Zeitler, E.: EELS as a fingerprint of the chemical co-ordination of light elements. Microscopy Microanalysis Microstructures 2 (2-3), S. 159 - 169 (1991)

Zeitler, E.: Bildverarbeitung — eine Einführung. Physik in unserer Zeit 22 (6), S. 267 - 273 (1991)