Publications of Markus Heyde

M. Heyde, M. Sterrer, H.-P. Rust and H.-J. Freund: Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum. Applied Physics Letters 87 (08), 083104–1-083104–3 (2005).

M. Kulawik, H.-P. Rust, N. Nilius, M. Heyde and H.-J. Freund: STM studies of ordered (√31x √31)R9° CO islands on Ag(111). Physical Review B 71 (15), 153405–1-153405–4 (2005).

M. Heyde, G. Thielsch, H.-P. Rust and H.-J. Freund: A reverse pendulum bath cryostat design suitable for low temperature scanning probe microscopy. Measurement Science & Technology 16 (3), 859–864 (2005).

C. Ritter, M. Heyde, B. Stegemann and K. Rademann: Contact-area dependence of frictional forces: Moving adsorbed antimony nanoparticles. Physical Review B 71 (8), 085405–1-085405–6 (2005).

M. Heyde, M. Kulawik, H.-P. Rust and H.-J. Freund: Double quartz tuning fork sensor for low temperature atomic force and scanning tunneling microscopy. Review of Scientific Instruments 75 (7), 2446–2450 (2004).

L. Gura, Z. Yang, H. Junkes, M. Heyde and H.-J. Freund: Going fast with STM imaging. In: Encyclopedia of Solid-Liquid Interfaces. (Eds.): K. Wandelt and G. Bussetti. Elsevier, Amsterdam, 612–626 (2023).

H.-J. Freund, M. Heyde, H. Kuhlenbeck, N. Nilius, T. Risse, S. Schauermann, T. Schmidt, S.K. Shaikhutdinov and M. Sterrer: Thin Oxide Films as Model Systems for Heterogeneous Catalysts. In: Springer Handbook of Surface Science. (Eds.): M. Rocca, T.S. Rahman, and L. Vattuone. Springer, Cham, 267–328 (2020).

C. Büchner, M. Heyde and H.-J. Freund: Transfer of 2D Silica Films. In: Encyclopedia of Interfacial Chemistry. (Ed.): K. Wandelt. Elsevier, Amsterdam, 360–366 (2018).

N. Nilius, M. Sterrer, M. Heyde and H.-J. Freund: Atomic Scale Characterization of Defects on Oxide Surfaces. In: Defects at Oxide Surfaces. (Eds.): J. Jupille and G. Thornton. (Springer Series in Surface Sciences)., 29–80 (2015).

C. Büchner, L. Lichtenstein, M. Heyde and H.-J. Freund: The Atomic Structure of Two-Dimensional Silica. In: Noncontact Atomic Force Microscopy. (Eds.): S. Morita, F.J. Giessibl, E. Meyer, and R. Wiesendanger. (NanoScience and Technology). Springer, Cham, 327–353 (2015).

M. Heyde, G.H. Simon and T. König: Study of thin oxide films with NC-AFM: Atomically resolved imaging and beyond. In: Noncontact Atomic Force Microscopy. (Eds.): S. Morita, F.J. Giessibl, and R. Wiesendanger. (NanoScience and Technology). Springer, Berlin, 143–167 (2009).

U.D. Schwarz, C. Ritter and M. Heyde: Nanotribological studies by nanoparticle manipulation. In: Fundamentals of Friction and Wear on the Nanoscale. (Eds.): E. Gnecco and E. Meyer. (NanoScience and Technology). Springer-Verlag, Berlin Heidelberg New York, 561–582 (2007).

H. Junkes, H.-J. Freund, L. Gura, M. Heyde, P. Marschalik and Z. Yang: Experiment Control With Epics7 and Symmetric Multiprocessing on RTEMS. In: Proceedings of the 16th International Conference on Accelerator and Large Experimental Control Systems. JACoW, Geneva, 1762–1766 (2018).

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