Publications of Thomas Schmidt

Genuzio, F.; Sala, A.; Schmidt, T.; Menzel, D.; Freund, H.-J.: Phase transformations in thin iron oxide films: Spectromicroscopic study of velocity and shape of the reaction fronts. Surface Science 648, pp. 177 - 187 (2016)

Klemm, H.; Peschel, G.; Madej, E.; Fuhrich, A.; Timm, M.; Menzel, D.; Schmidt, T.; Freund, H.-J.: Preparation of silica films on Ru(0001): A LEEM/PEEM study. Surface Science 643, pp. 45 - 51 (2016)

Marchetto, H.; Schmidt, T.; Groh, U.; Maier, F. C.; Lévesque, P. L.; Fink, R. H.; Freund, H.-J.; Umbach, E.: Direct observation of epitaxial organic film growth: temperature-dependent growth mechanisms and metastability. Physical Chemistry Chemical Physics 17 (43), pp. 29150 - 29160 (2015)

Genuzio, F.; Sala, A.; Schmidt, T.; Menzel, D.; Freund, H.-J.: Interconversion of α-Fe₂O₃ and Fe₃O₄ Thin Films: Mechanisms, Morphology, and Evidence for Unexpected Substrate Participation. The Journal of Physical Chemistry C 118 (50), pp. 29068 - 29076 (2014)

Schmidt, T.; Sala, A.; Marchetto, H.; Umbach, E.; Freund, H.-J.: First experimental proof for aberration correction in XPEEM: Resolution, transmission enhancement, and limitation by space charge effects. Ultramicroscopy 126, pp. 23 - 32 (2013)

Sala, A.; Marchetto, H.; Qin, Z.-H.; Shaikhutdinov, S. K.; Schmidt, T.; Freund, H.-J.: Defects and inhomogeneities in Fe₃O₄(111) thin film growth on Pt(111). Physical Review B 86 (15), 155430 (2012)

Casu, M. B.; Savu, S.-A.; Schuster, B.-E.; Biswas, I.; Raisch, C.; Marchetto, H.; Schmidt, T.; Chassé, T.: Island shapes and aggregation steered by the geometry of the substrate lattice. Chemical Communications 48 (55), pp. 6957 - 6959 (2012)

Freund, H.-J.; Nilius, N.; Risse, T.; Schauermann, S.; Schmidt, T.: Innovative measurement techniques in surface science. ChemPhysChem 12 (1), pp. 79 - 87 (2011)

Casu, M. B.; Schuster, B.-E.; Biswas, I.; Raisch, C.; Marchetto, H.; Schmidt, T.; Chassé, T.: Locally resolved core-hole screening, molecular orientation and morphology in thin films of diindenoperylene deposited on Au(111) single crystals. Advanced Materials 33, pp. 3740 - 3744 (2010)

Schmidt, T.; Marchetto, H.; Lévesque, P. L.; Groh, U.; Maier, F.; Preikszas, D.; Hartel, P.; Spehr, R.; Lilienkamp, G.; Engel, W. et al.; Fink, R.; Bauer, E.; Rose, H.; Umbach, E.; Freund, H.-J.: Double aberration correction in a low-energy electron microscope. Ultramicroscopy 110 (11), pp. 1358 - 1361 (2010)

Schmidt, T.: Spectromicroscopy: A Tool for In Situ Studies of Chemical Reactions on Surfaces at Nanometer Scale. Seminar, Spectroscopy in UniSysCat – Status and Perspectives, Online Event (2021)

Schmidt, T.: Spectromicroscopy: A Tool for In Situ Studies of Oxide Films and Thermal Reactions. E-MRS Fall Meeting 2021, Online Event (2021)

Schmidt, T.: Coupled Reactions Over Well-Defined Nanocatalysts. UniSysCat Meeting - Unit A, Online Event (2021)

Schmidt, T.: Spectro-Microscopic in Situ Studies of Electrochemistry and Thermal Reactions. FHI-Workshop on Current Research Topics at the FHI, Online Event (2020)

Schmidt, T.: Research Activities of the ISC Department at Bessy-II: Current State and Perspective. Workshop BESSY III expert meeting Heterogeneous catalysis/Chemistry at surfaces, Online Event (2020)

Schmidt, T.: Ultrathin Silica Films Studied by LEEM and XPEEM. SpectroNanoscopy 2017 workshop, Seoul, South Korea (2017)

Schmidt, T.: Growth, Morphology and Structure of Ultra-Thin Silica Films Studied by Spectro-Microscopy. FHI/CP-USTC/CP Workshop on Surface Chemistry of Oxides, Hefei, China (2017)

Schmidt, T.: Preparation and Structure of Ultrathin Silica Films Studied by LEEM and PEEM. FHI-Workshop on Current Research Topics at the FHI, Potsdam, Germany (2017)

Schmidt, T.: Morphology and Structure of Ultra-Thin Silica Films Unveiled by Spectro-Microscopy. 66th Yearly Meeting of the Austrian Physical Society, Vienna, Austria (2016)

Schmidt, T.: Aberration Corrected Spectro-Microscopy: Oxide Film Growth, a Case Study. 18th Meeting of the Fachbeirat of the Fritz-Haber-Institut, Berlin, Germany (2015)