Publications of Thomas König

G.H. Simon, T. König, L. Heinke, L. Lichtenstein, M. Heyde and H.-J. Freund: Atomic structure of surface defects in alumina studied by dynamic force microscopy: strain-relief-, translation- and reflection-related boundaries, including their junctions. New Journal of Physics 13 (12), 123028 (2011).

T. König, L. Heinke, G.H. Simon and M. Heyde: Three-dimensional electrostatic interactions in dynamic force microscopy: Experiment and theory. Physical Review B 83, 195435–1-195435–6 (2011).

T. König, G.H. Simon, L. Heinke, L. Lichtenstein and M. Heyde: Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy. Beilstein Journal of Nanotechnology 2, 1–14 (2011).

L. Heinke, L. Lichtenstein, G.H. Simon, T. König, M. Heyde and H.-J. Freund: Local work function differences at line defects in aluminium oxide on NiAl(110). ChemPhysChem 11 (10), 2085–2087 (2010).

L. Heinke, L. Lichtenstein, G.H. Simon, T. König, M. Heyde and H.-J. Freund: Structure and electronic properties of step edges in the aluminium oxide film on NiAl(110). Physical Review B 82, 075430–1-075430–6 (2010).

T. König, G.H. Simon, U. Martinez, L. Giordano, G. Paccioni, M. Heyde and H.-J. Freund: Direct measurement of the attractive interaction forces on F⁰ color centers on MgO(001) by dynamic force microscopy. ACS Nano 4 (5), 2510–2514 (2010).

G.H. Simon, T. König, H.-P. Rust, M.V. Ganduglia-Pirovano, J. Sauer, M. Heyde and H.-J. Freund: Imaging of individual adatoms on oxide surfaces by dynamic force microscopy. Physical Review B 81 (7), 073411–1-073411–4 (2010).

T. König, G.H. Simon, H.-P. Rust and M. Heyde: Work function measurements of thin oxide films on metals-MgO on Ag(001). The Journal of Physical Chemistry C 113 (26), 11301–11305 (2009).

T. König, G.H. Simon, H.-P. Rust and M. Heyde: Atomic resolution on a metal single crystal with dynamic force microscopy. Applied Physics Letters 95 (8), 083116–1-083116–3 (2009).

T. König, G.H. Simon, H.-P. Rust, G. Pacchioni, M. Heyde and H.-J. Freund: Measuring the charge state of point defects on MgO/Ag(001). Journal of the American Chemical Society 131 (46), 17544–17545 (2009).

H.-P. Rust, T. König, G.H. Simon, M. Nowicki, V. Simic-Milosevic, G. Thielsch, M. Heyde and H.-J. Freund: A portable microevaporator for low temperature single atom studies by scanning tunneling and dynamic force microscopy. Review of Scientific Instruments 80 (11), 113705–1-113705–4 (2009).

G.H. Simon, T. König, H.-P. Rust, M. Heyde and H.-J. Freund: Atomic structure of the ultrathin alumina on NiAl(110) and its antiphase domain boundaries as seen by frequency modulation dynamic force microscopy. New Journal of Physics 11, 093009–1-093009–16 (2009).

K. Kinoshita, G.H. Simon, T. König, M. Heyde, H.-J. Freund, Y. Nakagawa, S. Suzuki, W.-J. Chun, S.T. Oyama, S. Otani and K. Asakura: A scanning tunneling microscopy observation of (√3x√3)R30° reconstructed Ni₂P(0001). Japanese Journal of Applied Physics 47 (7), 6088–6091 (2008).

T. König, G.H. Simon, K.-H. Rieder, H.-P. Rust and M. Heyde: Superlattice structure of an Ar monolayer on Ag(111) observed by low-temperature scanning tunneling microscopy. Physical Review B 78 (20), 201407–1-201407–4 (2008).

V. Simic-Milosevic, M. Heyde, X. Lin, T. König, H.-P. Rust, M. Sterrer, T. Risse, N. Nilius, H.-J. Freund, L. Giordano and G. Pacchioni: Charge-induced formation of linear Au clusters on thin MgO films: Scanning tunneling microscopy and density-functional theory study. Physical Review B 78 (23), 235429 (2008).

V. Simic-Milosevic, M. Heyde, N. Nilius, T. König, H.-P. Rust, M. Sterrer, T. Risse, H.-J. Freund, L. Giordano and G. Pacchioni: Au dimers on thin MgO(001) films: flat and charged or upright and neutral? Journal of the American Chemical Society 130 (25), 7814–7815 (2008).

G.H. Simon, T. König, M. Nilius, H.-P. Rust, M. Heyde and H.-J. Freund: Atomically resolved force microscopy images of complex surface unit cells: Ultrathin alumina film on NiAl(110). Physical Review B 78 (11), 113401–1-113401–4 (2008).

M. Heyde, G.H. Simon and T. König: Study of thin oxide films with NC-AFM: Atomically resolved imaging and beyond. In: Noncontact Atomic Force Microscopy. (Eds.): S. Morita, F.J. Giessibl, and R. Wiesendanger. (NanoScience and Technology). Springer, Berlin, 143–167 (2009).

T. König: Investigation of defects on MgO films grown on Ag(001) - A combined dynamic force and scanning tunneling microscopy study. Technische Universität Berlin