Publications of Markus Heyde

C. Büchner, L. Lichtenstein, M. Heyde and H.-J. Freund: The Atomic Structure of Two-Dimensional Silica. In: Noncontact Atomic Force Microscopy. (Eds.): S. Morita, F.J. Giessibl, E. Meyer, and R. Wiesendanger. (NanoScience and Technology). Springer, Cham, 327–353 (2015).

N. Nilius, M. Sterrer, M. Heyde and H.-J. Freund: Atomic Scale Characterization of Defects on Oxide Surfaces. In: Defects at Oxide Surfaces. (Eds.): J. Jupille and G. Thornton. (Springer Series in Surface Sciences)., 29–80 (2015).

M. Heyde, G.H. Simon and T. König: Study of thin oxide films with NC-AFM: Atomically resolved imaging and beyond. In: Noncontact Atomic Force Microscopy. (Eds.): S. Morita, F.J. Giessibl, and R. Wiesendanger. (NanoScience and Technology). Springer, Berlin, 143–167 (2009).

U.D. Schwarz, C. Ritter and M. Heyde: Nanotribological studies by nanoparticle manipulation. In: Fundamentals of Friction and Wear on the Nanoscale. (Eds.): E. Gnecco and E. Meyer. (NanoScience and Technology). Springer-Verlag, Berlin Heidelberg New York, 561–582 (2007).

H. Junkes, H.-J. Freund, L. Gura, M. Heyde, P. Marschalik and Z. Yang: Experiment Control With Epics7 and Symmetric Multiprocessing on RTEMS. In: Proceedings of the 16th International Conference on Accelerator and Large Experimental Control Systems. JACoW, Geneva, 1762–1766 (2018).

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