Publikationen von Markus Heyde

Yang, B.; Kaden, W.; Yu, X.; Boscoboinik, A.; Martynova, Y.; Lichtenstein, L.; Heyde, M.; Sterrer, M.; Włodarczyk, R.; Sierka, M. et al.; Sauer, J.; Shaikhutdinov, S. K.; Freund, H.-J.: Thin silica films on Ru(0001): monolayer, bilayer and three-dimensional networks of [SiO₄] tetrahedra. Physical Chemistry Chemical Physics 14 (32), S. 11344 - 11351 (2012)

Lichtenstein, L.; Büchner, C.; Stuckenholz, S.; Heyde, M.; Freund, H.-J.: Enhanced atomic corrugation in dynamic force microscopy - The role of repulsive forces. Applied Physics Letters 100 (12), 123105 (2012)

Simon, G. H.; Heyde, M.; Freund, H.-J.: Imaging and manipulation of adatoms on an alumina surface by noncontact atomic force microscopy. Journal of Physics: Condensed Matter 24 (8), 084007 (2012)

Lichtenstein, L.; Büchner, C.; Yang, B.; Shaikhutdinov, S. K.; Heyde, M.; Sierka, M.; Wlodarczyk, R.; Sauer, J.; Freund, H.-J.: The atomic structure of a metal-supported vitreous thin silica film. Angewandte Chemie International Edition 51 (2), S. 404 - 407 (2012)

Lichtenstein, L.; Büchner, C.; Yang, B.; Shaikhutdinov, S. K.; Heyde, M.; Sierka, M.; Wlodarczyk, R.; Sauer, J.; Freund, H.-J.: Die atomare Struktur eines metallgestützten glasartigen dünnen Silikafilms. Angewandte Chemie 124 (2), S. 416 - 420 (2012)

Simon, G. H.; König, T.; Heinke, L.; Lichtenstein, L.; Heyde, M.; Freund, H.-J.: Atomic structure of surface defects in alumina studied by dynamic force microscopy: strain-relief-, translation- and reflection-related boundaries, including their junctions. New Journal of Physics 13 (12), 123028 (2011)

König, T.; Heinke, L.; Simon, G. H.; Heyde, M.: Three-dimensional electrostatic interactions in dynamic force microscopy: Experiment and theory. Physical Review B 83, S. 195435-1 - 195435-6 (2011)

König, T.; Simon, G. H.; Heinke, L.; Lichtenstein, L.; Heyde, M.: Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy. Beilstein Journal of Nanotechnology 2, S. 1 - 14 (2011)

Heinke, L.; Lichtenstein, L.; Simon, G. H.; König, T.; Heyde, M.; Freund, H.-J.: Local work function differences at line defects in aluminium oxide on NiAl(110). ChemPhysChem 11 (10), S. 2085 - 2087 (2010)

Heinke, L.; Lichtenstein, L.; Simon, G. H.; König, T.; Heyde, M.; Freund, H.-J.: Structure and electronic properties of step edges in the aluminium oxide film on NiAl(110). Physical Review B 82, S. 075430-1 - 075430-6 (2010)

König, T.; Simon, G. H.; Martinez, U.; Giordano, L.; Paccioni, G.; Heyde, M.; Freund, H.-J.: Direct measurement of the attractive interaction forces on F⁰ color centers on MgO(001) by dynamic force microscopy. ACS Nano 4 (5), S. 2510 - 2514 (2010)

Löffler, D.; Uhlrich, J.; Baron, M.; Yang, B.; Yu, X.; Lichtenstein, L.; Heinke, L.; Büchner, C.; Heyde, M.; Shaikhutdinov, S. et al.; Freund, H.-J.; Włodarczyk, R.; Sierka, M.; Sauer, J.: Growth and structure of crystalline silica sheet on Ru(0001). Physical Review Letters 105 (14), 146104 (2010)

Simon, G. H.; König, T.; Rust, H.-P.; Ganduglia-Pirovano, M. V.; Sauer, J.; Heyde, M.; Freund, H.-J.: Imaging of individual adatoms on oxide surfaces by dynamic force microscopy. Physical Review B 81 (7), S. 073411-1 - 073411-4 (2010)

König, T.; Simon, G. H.; Rust, H.-P.; Heyde, M.: Work function measurements of thin oxide films on metals-MgO on Ag(001). The Journal of Physical Chemistry C 113 (26), S. 11301 - 11305 (2009)

König, T.; Simon, G. H.; Rust, H.-P.; Heyde, M.: Atomic resolution on a metal single crystal with dynamic force microscopy. Applied Physics Letters 95 (8), S. 083116-1 - 083116-3 (2009)

König, T.; Simon, G. H.; Rust, H.-P.; Pacchioni, G.; Heyde, M.; Freund, H.-J.: Measuring the charge state of point defects on MgO/Ag(001). Journal of the American Chemical Society 131 (46), S. 17544 - 17545 (2009)

Rust, H.-P.; König, T.; Simon, G. H.; Nowicki, M.; Simic-Milosevic, V.; Thielsch, G.; Heyde, M.; Freund, H.-J.: A portable microevaporator for low temperature single atom studies by scanning tunneling and dynamic force microscopy. Review of Scientific Instruments 80 (11), S. 113705-1 - 113705-4 (2009)

Simon, G. H.; König, T.; Rust, H.-P.; Heyde, M.; Freund, H.-J.: Atomic structure of the ultrathin alumina on NiAl(110) and its antiphase domain boundaries as seen by frequency modulation dynamic force microscopy. New Journal of Physics 11, S. 093009-1 - 093009-16 (2009)

Albers, B.; Liebmann, M.; Schwendemann, T. C.; Baykara, M. Z.; Heyde, M.; Salmeron, M.; Altman, E. I.; Schwarz, U. D.: Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy. Review of Scientific Instruments 79 (3), S. 033704-1 - 033704-9 (2008)

Kinoshita, K.; Simon, G. H.; König, T.; Heyde, M.; Freund, H.-J.; Nakagawa, Y.; Suzuki, S.; Chun, W.-J.; Oyama, S. T.; Otani, S. et al.; Asakura, K.: A scanning tunneling microscopy observation of (√3x√3)R30° reconstructed Ni₂P(0001). Japanese Journal of Applied Physics 47 (7), S. 6088 - 6091 (2008)