Publikationen von Lars Heinke

Simon, G. H.; König, T.; Heinke, L.; Lichtenstein, L.; Heyde, M.; Freund, H.-J.: Atomic structure of surface defects in alumina studied by dynamic force microscopy: strain-relief-, translation- and reflection-related boundaries, including their junctions. New Journal of Physics 13 (12), 123028 (2011)

Heinke, L.; Kärger, J.: Correlating surface permeability with intracrystalline diffusivity in nanoporous solids. Physical Review Letters 106, S. 074501-1 - 074501-4 (2011)

Hibbe, F.; Chmelik, C.; Heinke, L.; Pramanik, S.; Li, J.; Ruthven, D. M.; Tzoulaki, D.; Kärger, J.: The nature of surface barriers on nanoporous solids explored by microimaging of transient guest distributions. Journal of the American Chemical Society 133 (9), S. 2804 - 2807 (2011)

König, T.; Heinke, L.; Simon, G. H.; Heyde, M.: Three-dimensional electrostatic interactions in dynamic force microscopy: Experiment and theory. Physical Review B 83, S. 195435-1 - 195435-6 (2011)

König, T.; Simon, G. H.; Heinke, L.; Lichtenstein, L.; Heyde, M.: Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy. Beilstein Journal of Nanotechnology 2, S. 1 - 14 (2011)

Tzoulaki, D.; Heinke, L.; Castro, M.; Cubillas, P.; Anderson, M. W.; Zhou, W.; Wright, P. A.; Kärger, J.: Assessing molecular transport properties of nanoporous materials by interference microscopy: remarkable effects of composition and microstructure on diffusion in the silicoaluminophosphate zeotype STA-7. Journal of the American Chemical Society 132, S. 11665 - 11670 (2010)

Chmelik, C.; Bux, H.; Caro, J.; Heinke, L.; Hibbe, F.; Titze, T.; Kärger, J.: Mass transfer in a nanoscale material enhanced by an opposing flux. Physical Review Letters 104 (8), 085902 (2010)

Heinke, L.; Lichtenstein, L.; Simon, G. H.; König, T.; Heyde, M.; Freund, H.-J.: Local work function differences at line defects in aluminium oxide on NiAl(110). ChemPhysChem 11 (10), S. 2085 - 2087 (2010)

Heinke, L.; Lichtenstein, L.; Simon, G. H.; König, T.; Heyde, M.; Freund, H.-J.: Structure and electronic properties of step edges in the aluminium oxide film on NiAl(110). Physical Review B 82, S. 075430-1 - 075430-6 (2010)

Löffler, D.; Uhlrich, J.; Baron, M.; Yang, B.; Yu, X.; Lichtenstein, L.; Heinke, L.; Büchner, C.; Heyde, M.; Shaikhutdinov, S. et al.; Freund, H.-J.; Włodarczyk, R.; Sierka, M.; Sauer, J.: Growth and structure of crystalline silica sheet on Ru(0001). Physical Review Letters 105 (14), 146104 (2010)