Publikationen von Alexander M. Bradshaw

Gardner, P.; Tüshaus, M.; Martin, R.; Bradshaw, A. M.: The adsorbate-induced removal of the Pt{100} surface reconstruction Part I: NO. Surface Science 240 (1-3), S. 112 - 124 (1990)

Radhakrishnan, G.; Stenzel, W.; Conrad, H.; Bradshaw, A. M.: Photoreactions of adsorbed CH₃Br on Pt(111). Applied Surface Science 46 (1-4), S. 36 - 43 (1990)

Heidebrecht, K.; Jansen, M.; Krause, S.; Bradshaw, A. M.: Characterization of silver-rich ternary oxides with photoelectron spectroscopy. Journal of Solid State Chemistry 89 (1), S. 60 - 66 (1990)

Robinson, A. W.; Woodruff, D. P.; Somers, J. S.; Kilcoyne, A. L. D.; Ricken, D. E.; Bradshaw, A. M.: Photoelectron diffraction study of the local adsorption site in the Cu(110)(2 × 3)-N structure. Surface Science 237 (1-3), S. 99 - 107 (1990)

Asensio, M. C.; Ashwin, M. J.; Kilcoyne, A. L. D.; Woodruf, D. P.; Robinson, A. W.; Lindner, T.; Somers, J. S.; Ricken, D. E.; Bradshaw, A. M.: The structure of oxygen adsorption phases on Cu(100). Surface Science 236 (1-2), S. 1 - 14 (1990)

Tüshaus, M.; Berndt, W.; Conrad, H.; Bradshaw, A. M.; Persson, B.: Understanding the structure of high coverage CO adlayers. Applied Physics A 51, S. 91 - 98 (1990)

Haase, J.; Hillert, B.; Bradshaw, A. M.: Comment on ‘‘Oxygen chemisorption on Cu(110): An atomic view by scanning tunneling microscopy’’. Physical Review Letters 64 (25), S. 386 - 386 (1990)

Johnson, R. L.; Barth, J.; Cardona, M.; Fuchs, D.; Bradshaw, A. M.: Design and performance of a VUV ellipsometer. Nuclear Instruments and Methods in Physics Research Section A 290 (2-3), S. 606 - 612 (1990)

Mundschau, M. V.; Kordesch, M. E.; Rausenberger, B.; Engel, W.; Bradshaw, A. M.; Zeitler, E.: Real-time observation of the nucleation and propagation of reaction fronts on surfaces using photoemission electron microscopy. Surface Science 227 (3), S. 246 - 260 (1990)

Robinson, A. W.; Somers, J. S.; Ricken, D. E.; Bradshaw, A. M.; Kilcoyne, A. L. D.; Woodruff, D. P.: A photoelectron diffraction study of Cu{110}-(2×1)-O. Surface Science 227 (3), S. 237 - 245 (1990)

Barth, J.; Johnson, R. L.; Cardona, M.; Fuchs, D.; Bradshaw, A. M.: The dielectric function of CaF₂ between 10 and 35 eV. Physical Review B 41 (5), S. 3291 - 3294 (1990)

Block, J. H.; Bradshaw, A. M.; Gravelle, P.C.; Haber, J.; Hansen, R.S.; Roberts, M.W.; Sheppard, N.; Tamaru, K.: A survey of experimental techniques in surface chemical physics. Pure and Applied Chemistry 62 (12), S. 2297 - 2322 (1990)

Selected Proceedings of the 7th International Conference on Solid Surfaces (ICSS-7), Köln 1989. Vacuum 41 (1990)

Bradshaw, A. M.; Somers, J. S.: X-ray Absorption Spectroscopy of Molecular Adsorbates. Physica Scripta T31, S. 189 - 198 (1990)

Eberhardt, W.; Randall, K. J.; Feldhaus, J.; Bradshaw, A. M.; Garrett, R. F.; Knotek, M. L.: The soft X-ray spectroscopy undulator beamline at NSLS X1. Physica Scripta 41 (6), S. 745 - 748 (1990)

Gardner, P.; Martin, R.; Tüshaus, M.; Bradshaw, A. M.: The adsorbate-induced lifting of the Pt100 surface reconstruction: IRAS investigations. Journal of Electron Spectroscopy and Related Phenomena 54-55, S. 619 - 628 (1990)

Kilcoyne, A. L. D.; Woodruff, D. P.; Robinson, A. W.; Lindner, T.; Robinson, A. W.; Somers, J. S.; Ricken, D. E.; Bradshaw, A. M.: Photoelectron diffraction study of O, N and C adsorption structures on Ni(100) and Cu(110). Faraday Discussions 89, S. 311 - 321 (1990)

Koch, A.; Schmidbauer, M.; Feldhaus, J.; Randall, K. J.; Bradshaw, A. M.: Angle-resolved photoelectron spectroscopy of the acetylene valence levels using undulator radiation. Journal of Electron Spectroscopy and Related Phenomena 51, S. 527 - 528 (1990)

Martin, R.; Gardner, P.; Tüshaus, M.; Bonev, C.; Bradshaw, A. M.; Jones, T. S.: The dehydrogenation of cyclohexane on Pt(100): the role of surface structure in determining the reaction pathway. Journal of Electron Spectroscopy and Related Phenomena 54-55, S. 773 - 778 (1990)

Persson, B. N. J.; Tüshaus, M.; Bradshaw, A. M.: On the nature of dense CO adlayers. The Journal of Chemical Physics 92 (8), S. 5034 - 5046 (1990)