Publications of Thomas König

Simon, G. H.; König, T.; Heinke, L.; Lichtenstein, L.; Heyde, M.; Freund, H.-J.: Atomic structure of surface defects in alumina studied by dynamic force microscopy: strain-relief-, translation- and reflection-related boundaries, including their junctions. New Journal of Physics 13 (12), 123028 (2011)

König, T.; Heinke, L.; Simon, G. H.; Heyde, M.: Three-dimensional electrostatic interactions in dynamic force microscopy: Experiment and theory. Physical Review B 83, pp. 195435-1 - 195435-6 (2011)

König, T.; Simon, G. H.; Heinke, L.; Lichtenstein, L.; Heyde, M.: Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy. Beilstein Journal of Nanotechnology 2, pp. 1 - 14 (2011)

Heinke, L.; Lichtenstein, L.; Simon, G. H.; König, T.; Heyde, M.; Freund, H.-J.: Local work function differences at line defects in aluminium oxide on NiAl(110). ChemPhysChem 11 (10), pp. 2085 - 2087 (2010)

Heinke, L.; Lichtenstein, L.; Simon, G. H.; König, T.; Heyde, M.; Freund, H.-J.: Structure and electronic properties of step edges in the aluminium oxide film on NiAl(110). Physical Review B 82, pp. 075430-1 - 075430-6 (2010)

König, T.; Simon, G. H.; Martinez, U.; Giordano, L.; Paccioni, G.; Heyde, M.; Freund, H.-J.: Direct measurement of the attractive interaction forces on F⁰ color centers on MgO(001) by dynamic force microscopy. ACS Nano 4 (5), pp. 2510 - 2514 (2010)

Simon, G. H.; König, T.; Rust, H.-P.; Ganduglia-Pirovano, M. V.; Sauer, J.; Heyde, M.; Freund, H.-J.: Imaging of individual adatoms on oxide surfaces by dynamic force microscopy. Physical Review B 81 (7), pp. 073411-1 - 073411-4 (2010)

König, T.; Simon, G. H.; Rust, H.-P.; Heyde, M.: Work function measurements of thin oxide films on metals-MgO on Ag(001). The Journal of Physical Chemistry C 113 (26), pp. 11301 - 11305 (2009)

König, T.; Simon, G. H.; Rust, H.-P.; Heyde, M.: Atomic resolution on a metal single crystal with dynamic force microscopy. Applied Physics Letters 95 (8), pp. 083116-1 - 083116-3 (2009)

König, T.; Simon, G. H.; Rust, H.-P.; Pacchioni, G.; Heyde, M.; Freund, H.-J.: Measuring the charge state of point defects on MgO/Ag(001). Journal of the American Chemical Society 131 (46), pp. 17544 - 17545 (2009)

Rust, H.-P.; König, T.; Simon, G. H.; Nowicki, M.; Simic-Milosevic, V.; Thielsch, G.; Heyde, M.; Freund, H.-J.: A portable microevaporator for low temperature single atom studies by scanning tunneling and dynamic force microscopy. Review of Scientific Instruments 80 (11), pp. 113705-1 - 113705-4 (2009)

Simon, G. H.; König, T.; Rust, H.-P.; Heyde, M.; Freund, H.-J.: Atomic structure of the ultrathin alumina on NiAl(110) and its antiphase domain boundaries as seen by frequency modulation dynamic force microscopy. New Journal of Physics 11, pp. 093009-1 - 093009-16 (2009)

Kinoshita, K.; Simon, G. H.; König, T.; Heyde, M.; Freund, H.-J.; Nakagawa, Y.; Suzuki, S.; Chun, W.-J.; Oyama, S. T.; Otani, S. et al.; Asakura, K.: A scanning tunneling microscopy observation of (√3x√3)R30° reconstructed Ni₂P(0001). Japanese Journal of Applied Physics 47 (7), pp. 6088 - 6091 (2008)

König, T.; Simon, G. H.; Rieder, K.-H.; Rust, H.-P.; Heyde, M.: Superlattice structure of an Ar monolayer on Ag(111) observed by low-temperature scanning tunneling microscopy. Physical Review B 78 (20), pp. 201407-1 - 201407-4 (2008)

Simic-Milosevic, V.; Heyde, M.; Lin, X.; König, T.; Rust, H.-P.; Sterrer, M.; Risse, T.; Nilius, N.; Freund, H.-J.; Giordano, L. et al.; Pacchioni, G.: Charge-induced formation of linear Au clusters on thin MgO films: Scanning tunneling microscopy and density-functional theory study. Physical Review B 78 (23), 235429 (2008)

Simic-Milosevic, V.; Heyde, M.; Nilius, N.; König, T.; Rust, H.-P.; Sterrer, M.; Risse, T.; Freund, H.-J.; Giordano, L.; Pacchioni, G.: Au dimers on thin MgO(001) films: flat and charged or upright and neutral? Journal of the American Chemical Society 130 (25), pp. 7814 - 7815 (2008)

Simon, G. H.; König, T.; Nilius, M.; Rust, H.-P.; Heyde, M.; Freund, H.-J.: Atomically resolved force microscopy images of complex surface unit cells: Ultrathin alumina film on NiAl(110). Physical Review B 78 (11), pp. 113401-1 - 113401-4 (2008)

Heyde, M.; Simon, G. H.; König, T.: Study of thin oxide films with NC-AFM: Atomically resolved imaging and beyond. In: Noncontact Atomic Force Microscopy, pp. 143 - 167 (Eds. Morita, S.; Giessibl, F. J.; Wiesendanger, R.). Springer, Berlin (2009)

König, T.: Investigation of defects on MgO films grown on Ag(001) - A combined dynamic force and scanning tunneling microscopy study. Dissertation, Technische Universität, Berlin (2010)