Publikationen von Benjamin Johnson

Johnson, B., R. Chinmoy, M. Greiner, R. Arrigo, M.E. Schuster, B. Höpfner, M. Gorgoi, I. Lauermann, M.G. Willinger, A. Knop-Gericke und R. Schlögl: Characterization of Platinum and Iridium Oxyhydrate Surface Layers from Platinum and Iridium Foils. ChemSusChem 9 (13), 1634–1646 (2016).

Strempel, V.E., D. Löffler, J. Kröhnert, K. Skorupska, B. Johnson, R.N. d’Alnoncourt, M. Driess und F. Rosowski: Enhancing of catalytic properties of vanadia via surface doping with phosphorus using atomic layer deposition. Journal of Vacuum Science and Technology A 34 (1), 01A135 (2016).

Greiner, M., T. Jones, B. Johnson, T. Rocha, Z.-J. Wang, M. Armbrüster, M.G. Willinger, A. Knop-Gericke und R. Schlögl: The oxidation of copper catalysts during ethylene epoxidation. Physical Chemistry Chemical Physics 17 (38), 25073–25089 (2015).

Greiner, M., T. Rocha, B. Johnson, A. Klyushin, A. Knop-Gericke und R. Schlögl: The Oxidation of Rhenium and Identification of Rhenium Oxides During Catalytic Partial Oxidation of Ethylene: An In-Situ XPS Study. Zeitschrift für physikalische Chemie 228 (4-5), 521–541 (2014).

Sarmiento-Pérez, R., S. Botti, C.S. Schnohr, I. Lauermann, A. Rubio und B. Johnson: Local versus global electronic properties of chalcopyrite alloys: X-ray absorption spectroscopy and ab initio calculations. Journal of Applied Physics 116 (9), 093703 (2014).

Guiet, A., T. Reier, N. Heidary, D. Felkel, B. Johnson, U. Vainio, H. Schlaad, Y. Aksu, M. Driess, P. Strasser, A. Thomas, J. Polte und A. Fischer: A One-Pot Approach to Mesoporous Metal Oxide Ultrathin Film Electrodes Bearing One Metal Nanoparticle per Pore with Enhanced Electrocatalytic Properties. Chemistry of Materials 25 (23), 4645–4652 (2013).

Johnson, B., F. Girgsdies, G. Weinberg, D. Rosenthal, A. Knop-Gericke, R. Schlögl, T. Reier und P. Strasser: Suitability of Simplified (Ir,Ti)O_x Films for Characterization during Electrocatalytic Oxygen Evolution Reaction. The Journal of Physical Chemistry C 117 (48), 25443–25450 (2013).

Johnson, B., J. Klaer, C.-H. Fischer und I. Lauermann: Depth profiling of a CdS buffer layer on CuInS₂ measured with X-ray photoelectron spectroscopy during removal by HCl etching. Thin solid films 520 (7), 2829–2832 (2012).