Publikationen von Hagen Klemm

Klemm, H., M. Prieto, F. Xiong, G.B. Hassine, M. Heyde, D. Menzel, M. Sierka, T. Schmidt und H.-J. Freund: A Silica Bilayer Supported on Ru(0001): Following the Crystalline-to Vitreous Transformation in Real Time with Spectro‐microscopy. Angewandte Chemie International Edition 59 (26), 10587–10593 (2020).

Klemm, H., M. Prieto, F. Xiong, G.B. Hassine, M. Heyde, D. Menzel, M. Sierka, T. Schmidt und H.-J. Freund: A Silica Bilayer Supported on Ru(0001): Following the Crystalline-to Vitreous Transformation in Real Time with Spectro‐Microscopy. Angewandte Chemie 132 (26), 10674–10680 (2020).

Klemm, H., M. Prieto, G. Peschel, A. Fuhrich, E. Madej, F. Xiong, D. Menzel, T. Schmidt und H.-J. Freund: Formation and Evolution of Ultrathin Silica Polymorphs on Ru(0001) Studied with Combined in Situ, Real-Time Methods. The Journal of Physical Chemistry C 123 (13), 8228–8243 (2019).

Hartmann, C., G. Sadoughi, R. Félix, E. Handick, H. Klemm, G. Peschel, E. Madej, A. Fuhrich, X. Liao, S. Raoux, D. Abou-Ras, D. Wargulski, T. Schmidt, R.G. Wilks, H. Snaith und M. Bär: Spatially Resolved Insight into the Chemical and Electronic Structure of Solution-Processed Perovskites-Why to (Not) Worry about Pinholes. Advanced Materials Interfaces 5 (5), 1701420 (2018).

Kuhness, D., H.J. Yang, H. Klemm, M. Prieto, G. Peschel, A. Fuhrich, D. Menzel, T. Schmidt, X. Yu, S.K. Shaikhutdinov, A. Lewandowski, M. Heyde, A. Kelemen, R. Włodarczyk, D. Usvyat, M. Schütz, J. Sauer und H.-J. Freund: A Two-Dimensional ‘Zigzag’ Silica Polymorph on a Metal Support. Journal of the American Chemical Society 140 (19), 6164–6168 (2018).

Prieto, M., H. Klemm, F. Xiong, D.M. Gottlob, D. Menzel, T. Schmidt und H.-J. Freund: Water Formation under Silica Thin Films: Real‐Time Observation of a Chemical Reaction in a Physically Confined Space. Angewandte Chemie International Edition 57 (28), 8749–8753 (2018).

Prieto, M., H. Klemm, F. Xiong, D.M. Gottlob, D. Menzel, T. Schmidt und H.-J. Freund: Wasserbildung unter dünnen Silika-Filmen: Echtzeitbeobachtung einer chemischen Reaktion in einem physikalisch eingegrenzten Raum. Angewandte Chemie 130 (28), 8885–8889 (2018).

Breuer, T., A. Karthäuser, H. Klemm, F. Genuzio, G. Peschel, A. Fuhrich, T. Schmidt und G. Witte: Exceptional Dewetting of Organic Semiconductor Films: The Case of Dinaphthothienothiophene (DNTT) at Dielectric Interfaces. ACS Applied Materials and Interfaces 9 (9), 8384–8392 (2017).

Cooil, S.P., F. Mazzola, H. Klemm, G. Peschel, Y.R. Niu, A.A. Zakharov, M.Y. Simmons, T. Schmidt, D.A. Evans, J.A. Miwa und J.W. Wells: In Situ Patterning of Ultrasharp Dopant Profiles in Silicon. ACS Nano 11 (2), 1683–1688 (2017).

Schulz, K., R. Schmack, H. Klemm, A. Kabelitz, T. Schmidt, F. Emmerling und R. Kraehnert: Mechanism and Kinetics of Hematite Crystallization in Air: Linking Bulk and Surface Models via Mesoporous Films with Defined Nanostructure. Chemistry of Materials 29 (4), 1724–1734 (2017).

Cooil, S.P., E.A. Mørtsell, F. Mazzola, M. Jorge, S. Wenner, M.T. Edmonds, L. Thomsen, H. Klemm, G. Peschel, A. Fuhrich, M. Prieto, T. Schmidt, J.A. Miwa, R. Holmestad und J.W. Wells: Thermal migration of alloying agents in aluminium. Materials Research Express 3 (11), 116501 (2016).

Klemm, H., G. Peschel, E. Madej, A. Fuhrich, M. Timm, D. Menzel, T. Schmidt und H.-J. Freund: Preparation of silica films on Ru(0001): A LEEM/PEEM study. Surface Science 643, 45–51 (2016).

Klemm, H.:

Schmidt, T., A. Sala, H. Marchetto, H. Klemm, F. Genuzio, S.K. Shaikhutdinov und H.-J. Freund:

Klemm, H.: Formation and properties of ultrathin silicon dioxide films on Ru(0001): an in-situ spectro-microscopy study. Technische Universität Berlin