Publikationen von Thomas Schmidt

Sterrer, M., N. Nilius, S.K. Shaikhutdinov, M. Heyde, T. Schmidt und H.-J. Freund: Interaction of water with oxide thin film model systems. Journal of Materials Research 34 (3), 360–378 (2019).

Hartmann, C., G. Sadoughi, R. Félix, E. Handick, H. Klemm, G. Peschel, E. Madej, A. Fuhrich, X. Liao, S. Raoux, D. Abou-Ras, D. Wargulski, T. Schmidt, R.G. Wilks, H. Snaith und M. Bär: Spatially Resolved Insight into the Chemical and Electronic Structure of Solution-Processed Perovskites-Why to (Not) Worry about Pinholes. Advanced Materials Interfaces 5 (5), 1701420 (2018).

Kuhness, D., H.J. Yang, H. Klemm, M. Prieto, G. Peschel, A. Fuhrich, D. Menzel, T. Schmidt, X. Yu, S.K. Shaikhutdinov, A. Lewandowski, M. Heyde, A. Kelemen, R. Włodarczyk, D. Usvyat, M. Schütz, J. Sauer und H.-J. Freund: A Two-Dimensional ‘Zigzag’ Silica Polymorph on a Metal Support. Journal of the American Chemical Society 140 (19), 6164–6168 (2018).

Michalak, N., Z. Miłosz, G. Peschel, M. Prieto, F. Xiong, P. Wojciechowski, T. Schmidt und M. Lewandowski: Symmetry-Induced Structuring of Ultrathin FeO and Fe₃O₄ Films on Pt(111) and Ru(0001). Nanomaterials 8 (9), 719 (2018).

Prieto, M., H. Klemm, F. Xiong, D.M. Gottlob, D. Menzel, T. Schmidt und H.-J. Freund: Water Formation under Silica Thin Films: Real‐Time Observation of a Chemical Reaction in a Physically Confined Space. Angewandte Chemie International Edition 57 (28), 8749–8753 (2018).

Prieto, M., H. Klemm, F. Xiong, D.M. Gottlob, D. Menzel, T. Schmidt und H.-J. Freund: Wasserbildung unter dünnen Silika-Filmen: Echtzeitbeobachtung einer chemischen Reaktion in einem physikalisch eingegrenzten Raum. Angewandte Chemie 130 (28), 8885–8889 (2018).

Schmidt, T., H. Marchetto, U. Groh, R.H. Fink, H.-J. Freund und E. Umbach: Influence of Substrate Bonding and Surface Morphology on Dynamic Organic Layer Growth: Perylenetetracarboxylic Dianhydride on Au(111). Langmuir 34 (19), 5444–5453 (2018).

Breuer, T., A. Karthäuser, H. Klemm, F. Genuzio, G. Peschel, A. Fuhrich, T. Schmidt und G. Witte: Exceptional Dewetting of Organic Semiconductor Films: The Case of Dinaphthothienothiophene (DNTT) at Dielectric Interfaces. ACS Applied Materials and Interfaces 9 (9), 8384–8392 (2017).

Cooil, S.P., F. Mazzola, H. Klemm, G. Peschel, Y.R. Niu, A.A. Zakharov, M.Y. Simmons, T. Schmidt, D.A. Evans, J.A. Miwa und J.W. Wells: In Situ Patterning of Ultrasharp Dopant Profiles in Silicon. ACS Nano 11 (2), 1683–1688 (2017).

Pollinger, F., S. Schmitt, D. Sander, Z. Tian, J. Kirschner, P. Vrdoljak, C. Stadler, F. Maier, H. Marchetto, T. Schmidt, A. Schöll und E. Umbach: Nanoscale patterning, macroscopic reconstruction, and enhanced surface stress by organic adsorption on vicinal surfaces. New Journal of Physics 19 (1), 013019 (2017).

Prieto, M. und T. Schmidt: LEEM and PEEM as Probing Tools to Address Questions in Catalysis. Catalysis Letters 147 (10), 2487–2497 (2017).

Schulz, K., R. Schmack, H. Klemm, A. Kabelitz, T. Schmidt, F. Emmerling und R. Kraehnert: Mechanism and Kinetics of Hematite Crystallization in Air: Linking Bulk and Surface Models via Mesoporous Films with Defined Nanostructure. Chemistry of Materials 29 (4), 1724–1734 (2017).

Tinti, G., H. Marchetto, C.A.F. Vaz, A. Kleibert, M. Andrä, R. Barten, A. Bergamaschi, M. Brückner, S. Cartier, R. Dinapoli, T. Franz, E. Fröjdh, D. Greiffenberg, C. Lopez-Cuenca, D. Mezza, A. Mozzanica, F. Nolting, M. Ramilli, S. Redford, M. Ruat, C. Ruder, L. Schädler, T. Schmidt, B. Schmitt, F. Schütz, X. Shi, D. Thattil, S. Vetter und J. Zhang: The EIGER detector for low-energy electron microscopy and photoemission electron microscopy. Journal of Synchrotron Radiation 24 (5), 963–974 (2017).

Cooil, S.P., E.A. Mørtsell, F. Mazzola, M. Jorge, S. Wenner, M.T. Edmonds, L. Thomsen, H. Klemm, G. Peschel, A. Fuhrich, M. Prieto, T. Schmidt, J.A. Miwa, R. Holmestad und J.W. Wells: Thermal migration of alloying agents in aluminium. Materials Research Express 3 (11), 116501 (2016).

Genuzio, F., A. Sala, T. Schmidt, D. Menzel und H.-J. Freund: Phase transformations in thin iron oxide films: Spectromicroscopic study of velocity and shape of the reaction fronts. Surface Science 648, 177–187 (2016).

Klemm, H., G. Peschel, E. Madej, A. Fuhrich, M. Timm, D. Menzel, T. Schmidt und H.-J. Freund: Preparation of silica films on Ru(0001): A LEEM/PEEM study. Surface Science 643, 45–51 (2016).

Lévesque, P.L., H. Marchetto, T. Schmidt, F.C. Maier, H.-J. Freund und E. Umbach: Correlation Between Substrate Morphology and the Initial Stages of Epitaxial Organic Growth: PTCDA/Ag(111). The Journal of Physical Chemistry C 120 (34), 19271–19279 (2016).

Marchetto, H., T. Schmidt, U. Groh, F.C. Maier, P.L. Lévesque, R.H. Fink, H.-J. Freund und E. Umbach: Direct observation of epitaxial organic film growth: temperature-dependent growth mechanisms and metastability. Physical Chemistry Chemical Physics 17 (43), 29150–29160 (2015).

Genuzio, F., A. Sala, T. Schmidt, D. Menzel und H.-J. Freund: Interconversion of α-Fe₂O₃ and Fe₃O₄ Thin Films: Mechanisms, Morphology, and Evidence for Unexpected Substrate Participation. The Journal of Physical Chemistry C 118 (50), 29068–29076 (2014).

Schmidt, T., A. Sala, H. Marchetto, E. Umbach und H.-J. Freund: First experimental proof for aberration correction in XPEEM: Resolution, transmission enhancement, and limitation by space charge effects. Ultramicroscopy 126, 23–32 (2013).