Publications of Thomas Schmidt

Schmidt, T.: Morphology and Structure of Ultra-Thin Silica Films Unveiled by Spectro-Microscopy. 66th Yearly Meeting of the Austrian Physical Society, Vienna, Austria (2016)

Schmidt, T.: Aberration Corrected Spectro-Microscopy: Oxide Film Growth, a Case Study. 18th Meeting of the Fachbeirat of the Fritz-Haber-Institut, Berlin, Germany (2015)

Schmidt, T.: Iron oxide film growth studied by aberration-corrected spectromicroscopy. Seminar, MAXLab, Lund, Sweden (2015)

Schmidt, T.: Spectromicroscopic Investigations of Thin Oxide Films. FHI-Workshop on Current Research Topics at the FHI , Potsdam, Germany (2014)

Schmidt, T.: LEEM/PEEM Basics. Workshop on X-Ray and Electron Beams for Materials Characterization, Philipps-University Marburg, Marburg, Germany (2013)

Schmidt, T.: LEEM/PEEM Studies on Thin Film Growth. Workshop on X-Ray and Electron Beams for Materials Characterization, Philipps-University Marburg, Marburg, Germany (2013)

Schmidt, T.; Sala, A.; Marchetto, H.; Freund, H.-J.: Dynamic behavior of anti-phase boundaries in the layer-by-layer growth of Fe₃O₄(111)/Pt(111) thin films. DPG-Frühjahrstagung, Regensburg (2013)

Genuzio, F.; Sala, A.; Schmidt, T.; Freund, H.-J.: Low pressure formation of α-Fe₂O₃(0001) on Pt(111). LEEM-PEEM-8, Hongkong (2012)

Schmidt, T.; Sala, A.; Marchetto, H.; Klemm, H.; Genuzio, F.; Shaikhutdinov, S. K.; Freund, H.-J.: LEEM/LEED investigation of Fe₃O₄ thin film growth on a Pt(111) substrate (111). DPG-Frühjahrstagung, Berlin (2012)