Publikationen von T. Giebel

Franco, N.; Chrost, J.; Avilaa, J.; Asensioa, M.C.; Müller, C.; Dudzik, E.; Patchett, A.J.; McGovern, I.T.; Giebel, T.; Lindsay, R. et al.; Fritzsche, V.; Bradshaw, A. M.; Woodruff, D.P.: Structural determination for H₂O adsorption on Si(001)2 × 1 using scanned-energy mode photoelectron diffraction. Applied Surface Science 123-124, S. 219 - 222 (1998)