Publikationen von Jens Paggel

Baumgärtel, P.; Paggel, J.; Hasselblatt, M.; Horn, K.; Fernandez, V.; Schaff, O.; Weaver, J. H.; Bradshaw, A. M.; Woodruff, D. P.; Rotenberg, E. et al.; Denlinger, J.: Structure determination of the (√3×√3)R30° boron phase on the Si(111) surface using photoelectron diffraction. Physical Review B 59 (20), S. 13014 - 13019 (1999)

Paggel, J.; Neuhold, G.; Haak, H.; Horn, K.: Growth morphology and electronic structure of Na films on Si(111)-(7×7) and Si(111)-Na(3×1). Surface Science 414 (1-2), S. 221 - 235 (1998)

Chassé, T.; Neuhold, G.; Paggel, J.; Horn, K.: Investigation of the Sn/GaP(110) interface by core level photoemission: interface reaction, growth morphology and surface photovoltage effects. Applied Surface Science 115 (4), S. 326 - 335 (1997)

Neuhold, G.; Chassé, T.; Paggel, J.; Horn, K.: Observation of a Cs-induced state in the band gap of GaP(110): Alkali-metal bonding and Fermi-level pinning. Physical Review B 54 (12), S. 8623 - 8626 (1996)

Paggel, J.; Theis, W.; Horn, K.; Jung, C.; Hellwig, C.; Petersen, H.: Correlation of surface core levels and structural building blocks for the Si(111)-7×7 reconstruction through high-resolution core-level spectroscopy. Physical Review B 50 (24), S. 18 686 - 18 689 (1994)

Öfner, H.; Hofmann, R.; Kraft, J.; Netzer, F. P.; Paggel, J.; Horn, K.: Metal-overlayer-induced charge-transfer effects in thin SiO₂-Si structures. Physical Review B 50 (20), S. 15 120 - 15 126 (1994)

Paggel, J.; Förster, M.: An artefact in scanning tunneling microscopy images of highly oriented pyrolytic graphite. Applied Physics A 59, S. 419 - 425 (1994)

Chassé, T.; Paggel, J.; Neuhold, G.; Theis, W.; Horn, K.: Photoemission study of the Cs⧸GaP(110) interface at low temperatures. Surface Science 307-309 (A), S. 295 - 302 (1994)

Paggel, J.: Elektronische und geometrische Struktur von Metall/Halbleitergrenzflächen: Na/Si(111). Dissertation, Freie Universität, Berlin (1994)