Spectroscopy and Diffraction Methods

Spectroscopy and Diffraction Methods

Our laboratories are equipped with instruments capable of observing chemical reactions under ultra high vacuum (UHV), atmospheric pressure, and electrochemical conditions.

Fourier-Transform Infrared Spectroscopy

  • Bruker Vertex 80v FT-IR spectrometer
    • Spectral resolution of 0.2 cm-1
    • A530/x reflection unit for in situ monitoring of electrochemical reactions

Raman Spectroscopy

  • Renishaw inVia Reflex confocal Raman microscope
    • Wavelength range: 200 - 2200 nm
    • Spectral resolution: 0.3 cm-1
    • Spatial resolution, lateral: 0.25 μm, axial: < 1 μm
    • WiRE software for electrochemical reaction tracking

X-Ray Absorption Spectroscopy

Lab-based X-ray absorption spectroscopy (XAS) for sample screening and long-term catalytic stability tests. The system allows the acquisition of XANES and EXAFS spectra and is to be used in combination with synchrotron XAS measurements.

  • High resolution hard x-ray monochromator, monochromatic flux of 300 000 photons per second at energy range of 7-9 keV
  • X-ray tube 1.2 kW power
  • X-ray energy resolving SDD-type detector, energy resolution 300 eV

X-Ray Diffraction

  • Determination of catalyst bulk and surface crystallinity. Capabilities for conducting operando thermal catalysis and operando electrochemical measurements in order to gain insight into the role of the catalyst structure on its activity and degradation.
  • Bruker D8 Advance
    • Powder and reflectivity modes
    • Grazing (GIXRD), X-ray reflectivity (XRR) modes for flat substrates
    • Modular DAVINCI system: X-ray tube, optics (slits), sample stage, detectors
  • Cu and Mo anodes at 8046.3 eV and 17480 eV, respectively
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