![Ultraviolet Photoelectron Spectroscopy (UPS) Ultraviolet Photoelectron Spectroscopy (UPS)](/464610/header_image-1597425205.jpg?t=eyJ3aWR0aCI6ODQ4LCJmaWxlX2V4dGVuc2lvbiI6ImpwZyIsIm9ial9pZCI6NDY0NjEwfQ%3D%3D--eca5f97b655e1b789444433b69aef696a3052389)
Ultraviolet Photoelectron Spectroscopy (UPS)
SMART
- BESSY-II instrument
- Multiple-technique sample characterisation for photoemission electron microscopy (PEEM)
- UPS combined with XPEEM, NEXAFS-PEEM, LEEM, NEXAFS, XPS, XMCD, XMLD, photoelectron diffraction (PED), valence band structure mapping, and LEED
- Comprehensive characterization of inhomogeneous surfaces and thin films