Ultraviolet Photoelectron Spectroscopy (UPS)

Ultraviolet Photoelectron Spectroscopy (UPS)

SMART

  • BESSY-II instrument
  • Multiple-technique sample characterisation for photoemission electron microscopy (PEEM)
  • UPS combined with XPEEM, NEXAFS-PEEM, LEEM, NEXAFS, XPS,  XMCD, XMLD, photoelectron diffraction (PED), valence band structure mapping, and LEED
  • Comprehensive characterization of inhomogeneous surfaces and thin films
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