Ultraviolet Photoelectron Spectroscopy (UPS)

SMART

• BESSY-II instrument
• Multiple-technique sample characterisation for photoemission electron microscopy (PEEM)
• UPS combined with XPEEM, NEXAFS-PEEM, LEEM, NEXAFS, XPS,  XMCD, XMLD, photoelectron diffraction (PED), valence band structure mapping, and LEED
• Comprehensive characterization of inhomogeneous surfaces and thin films