Publications of Peter Kratzer

Journal Article (50)

2004
Journal Article
E. Penev, P. Kratzer and M. Scheffler: Atomic structure of the GaAs(001)-c(4 x 4) surface: first-principles evidence for diversity of heterodimer motifs. Physical Review Letters 93 (14), 146102–1-146102–4 (2004).
Journal Article
J. Márquez, P. Kratzer and K. Jacobi: Structure and morphology of the As-rich and the stoichiometric GaAs(114)A surface. Journal of Applied Physics 95 (12), 7645–7654 (2004).
Journal Article
H. Wu, M. Hortamani, P. Kratzer and M. Scheffler: First-principles study of ferromagnetism in epitaxial Si-Mn thin films on Si(001). Physical Review Letters 92, 23 (2004).
Journal Article
E. Penev, S. Stojkovic, P. Kratzer and M. Scheffler: Anisotropic diffusion of In adatoms on pseudomorphic InxGa1-xAs(001) films: First-principles total energy calculations. Physical Review B 69, 115335–1-115335–10 (2004).
2003
Journal Article
R. Santoprete, B. Koiller, R.B. Capaz, P. Kratzer, Q.K.K. Liu and M. Scheffler: Tight-binding study of the influence of the strain on the electronic properties of InAs/GaAs quantum dots. Physical Review B 68, 235311–1-235311–9 (2003).
Journal Article
Y. Temko, T. Suzuki, P. Kratzer and K. Jacobi: InAs quantum dots grown on the GaAs(113)A and GaAs(-1-1-3)B surfaces: A comparative STM study. Physical Review B 68 (16), 165310–1-165310–12 (2003).
Journal Article
P. Kratzer, E. Penev and M. Scheffler: Understanding the growth mechanisms of GaAs and InGaAs thin films by employing first-principles calculations. Applied Surface Science 216 (1-4), 436–446 (2003).
2002
Journal Article
L. Geelhaar, Y. Temko, J. Márquez, P. Kratzer and K. Jacobi: Surface structure of GaAs(2 5 11). Physical Review B 65 (15), 155308–1-155308–13 (2002).
Journal Article
C. Filippi, S.B. Healy, P. Kratzer, E. Pehlke and M. Scheffler: Quantum Monte Carlo calculations of H2 dissociation on Si(001). Physical Review Letters 89 (16), 166102 (2002).
Journal Article
P. Kratzer, E. Penev and M. Scheffler: First-principles studies of kinetics in epitaxial growth of III-V semiconductors. Applied Physics A 75, 79–88 (2002).
Journal Article
P. Kratzer and M. Scheffler: Reaction-limited island nucleation in molecular beam epitaxy of compound semiconductors. Physical Review Letters 88 (3), 036102 (2002).
2001
Journal Article
P. Kratzer and M. Scheffler: Surface Knowledge: Toward a Predictive Theory of Materials. Computing in Science & Engineering 3 (6), 16–25 (2001).
Journal Article
L. Aballe, C. Rogero, P. Kratzer, S. Gokhale and K. Horn: Probing interface electronic structure with overlayer quantum-well resonances: Al/Si(111). Physical Review Letters 87 (15), 156801 (2001).
Journal Article
E. Penev, P. Kratzer and M. Scheffler: Effect of strain on surface diffusion in semiconductor heteroepitaxy. Physical Review B 64 (8), 085401 (2001).
Journal Article
L.G. Wang, P. Kratzer, M. Scheffler and Q.K.K. Liu: Island dissolution during capping layer growth interruption. Applied Physics A 73 (2), 161–165 (2001).
Journal Article
S.B. Healy, C. Filippi, P. Kratzer, E. Penev and M. Scheffler: The role of electronic correlation in the Si(100) reconstruction: a quantum Monte Carlo study. Physical Review Letters 87 (01), 016105 (2001).
Journal Article
L. Geelhaar, J. Márquez, P. Kratzer and K. Jacobi: GaAs(2511): A New Stable Surface within the Stereographic Triangle. Physical Review Letters 86 (17), 3815–3818 (2001).
Journal Article
J. Márquez, P. Kratzer, L. Geelhaar, K. Jacobi and M. Scheffler: Atomic structure of the stoichiometric GaAs(114) surface. Physical Review Letters 86 (1), 115–118 (2001).
2000
Journal Article
L.G. Wang, P. Kratzer and M. Scheffler: Energetics of InAs Thin Films and Islands on the GaAs(001) Substrate. Japanese Journal of Applied Physics 39 (7B), 4298–4301 (2000).
Journal Article
V.P. LaBella, D.W. Bullock, Z. Ding, C. Emery, P.M. Thibado, P. Kratzer and M. Scheffler: A novel imaging mechanism to determine the atomic structure of the GaAs(001)-(2x4) surface. Omicron Newsletter 4, 4–5 (2000).
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