Publikationen von Robert Schlögl

Schlögl, R.: Wohin entwickelt sich das wissenschaftliche Informationswesen? Erfahrungen und Erkenntnisse aus der Max-Planck-Gesellschaft. Physikalische Blätter 55 (11), S. 3 (1999)

Zemlin, F.; Beckmann, E.; Charlé, K.-P.; Schatz, M.; Schlögl, R.: Solid nitrogen: electron microscopy and beam damage quantification at 4 K. Ultramicroscopy 80 (3), S. 153 - 161 (1999)

Fischer, A.; Jentoft, F. C.; Weinberg, G.; Schlögl, R.; Niesen, T. P.; Bill, J.; Aldinger, F.; De Guire, M. R.; Ruehle, M.: Characterization of thin films containing zirconium, oxygen, and sulfur by scanning electron and atomic force microscopy. Journal of Materials Research 14 (9), S. 3725 - 3733 (1999)

Savinova, E. R.; Zemlyanov, D.; Scheybal, A.; Schedel-Niedrig, T.; Doblhofer, K.; Schlögl, R.: Ex-situ XPS study of the interface between a Ag(111) electrode and an alkaline electrolyte. 1. Influence of the emersion potential on the adsorption of oxygen species. Langmuir 15 (19), S. 6546 - 6551 (1999)

Savinova, E. R.; Zemlyanov, D.; Scheybal, A.; Schlögl, R.; Doblhofer, K.: Ex-situ XPS study of the interface between a Ag(111) electrode and an alkaline electrolyte. 2. Structure of the double layer. Langmuir 15 (19), S. 6552 - 6556 (1999)

Nepijko, S. A.; Klimenkov, M.; Adelt, M.; Kuhlenbeck, H.; Schlögl, R.; Freund, H.-J.: Structural Investigation of Palladium Clusters on γ-AlO₃(111)/NiAl(110) with Transmission Electron Microscopy. Langmuir 15 (16), S. 5309 - 5313 (1999)

Melsheimer, J.; Mahmoud, S. S.; Mestl, G.; Schlögl, R.: In situ UV-VIS diffuse reflectance spectroscopy of reduction-reoxidation of heteropoly compounds by methanol and ethanol: A correlation between spectroscopic and catalytic data. Catalysis Letters 60 (3), S. 103 - 111 (1999)

Find, J.; Herein, D.; Uchida, Y.; Schlögl, R.: A new three-dimensional structural model for the CuCl₂ graphite intercalation compound. Carbon 37 (9), S. 1431 - 1441 (1999)

Niesen, T. P.; De Guire, M. R.; Bill, J.; Aldinger, F.; Rühle, M.; Fischer, A.; Jentoft, F. C.; Schlögl, R.: Atomic force microscopy studies of oxide thin films on organic self-assembled monolayers. Journal of Materials Research 14 (6), S. 2464 - 2475 (1999)

Niesen, T. P.; Guire, M. R. D.; Bill, J.; Aldinger, F.; Rühle, M.; Fischer, A.; Jentoft, F. C.; Schlögl, R.: Atomic force microscopic studies of oxide thin films on organic self-assembled monolayers. Journal of Materials Research 14 (6), S. 2464 - 2475 (1999)

Bao, X.; Wild, U.; Muhler, M.; Pettinger, B.; Schlögl, R.; Ertl, G.: Coadsorption of nitric oxide and oxygen on Ag(110) surface. Surface Science 425 (2-3), S. 224 - 232 (1999)

Artelt, S.; Creutzenberg, O.; Kock, H.; Levsen, K.; Nachtigall, D.; Heinrich, U.; Rühle, T.; Schlögl, R.: Bioavailability of fine dispersed platinum as emitted from automotive catalytic converters: a model study. Science of the Total Environment 228 (2-3), S. 219 - 242 (1999)

Nagy, A. J.; Mestl, G.; Herein, D.; Weinberg, G.; Kitzelmann, E.; Schlögl, R.: The correlation of subsurface oxygen diffusion with variations of silver morphlogy in the silver-oxygen system. Journal of Catalysis 182 (2), S. 417 - 429 (1999)

Nagy, A. J.; Mestl, G.; Herein, D.; Weinberg, G.; Kitzelmann, E.; Schlögl, R.: The Correlation of Subsurface Oxygen Diffusion with Variations of Silver Morphology in the Silver–Oxygen System. Journal of Catalysis 182 (2), S. 417 - 429 (1999)

Grote, H.; Bohmeyer, W.; Kornejew, P.; Reiner, H. D.; Fussmann, G.; Schlögl, R.; Weinberg, G.; Wu, C. H.: Chemical sputtering yields of carbon based materials at high ion flux densities. Journal of Nuclear Materials 269, S. 1059 - 1064 (1999)

Bems, B.; Jentoft, F. C.; Schlögl, R.: Photoinduced decomposition of nitrate in drinking water in the presence of titania and humic acids. Applied Catalysis B 20 (2), S. 155 - 163 (1999)

Atamny, F.; Spillecke, O.; Schlögl, R.: On the STM imaging contrast of graphite: towards a “true’' atomic resolution. Physical Chemistry Chemical Physics 1 (17), S. 4113 - 4118 (1999)

Uchida, Y.; Spillecke, O.; Lehmpfuhl, G.; Preusser, A.; Weiss, K.; Schlögl, R.: Determination of the Mean Absorption Potential of Si for Electrons by Energy Loss Spectroscopy. Crystal Research and Technology 34 (1), S. 103 - 113 (1999)

Böhm, M. C.; Schulte, J.; Schütt, J.; Schedel-Niedrig, T.; Werner, H.; Schlögl, R.: Ba_xC₆₀ fullerides: π Electronic peculiarities of the C₆₀ molecule and their consequences for the solid state. International Journal of Quantum Chemistry 65 (4), S. 333 - 337 (1998)

Zemlyanov, D. Y.; Savinova, E.; Scheybal, A.; Doblhofer, K.; Schlögl, R.: XPS observation of OH groups incorporated in an Ag(111) electrode. Surface Science 418 (2), S. 441 - 456 (1998)