Publikationen von Benjamin Johnson

Johnson, B.; Chinmoy, R.; Greiner, M.; Arrigo, R.; Schuster, M. E.; Höpfner, B.; Gorgoi, M.; Lauermann, I.; Willinger, M. G.; Knop-Gericke, A. et al.; Schlögl, R.: Characterization of Platinum and Iridium Oxyhydrate Surface Layers from Platinum and Iridium Foils. ChemSusChem 9 (13), S. 1634 - 1646 (2016)

Strempel, V. E.; Löffler, D.; Kröhnert, J.; Skorupska, K.; Johnson, B.; d’Alnoncourt, R. N.; Driess, M.; Rosowski, F.: Enhancing of catalytic properties of vanadia via surface doping with phosphorus using atomic layer deposition. Journal of Vacuum Science and Technology A 34 (1), 01A135 (2016)

Greiner, M.; Jones, T.; Johnson, B.; Rocha, T.; Wang, Z.-J.; Armbrüster, M.; Willinger, M. G.; Knop-Gericke, A.; Schlögl, R.: The oxidation of copper catalysts during ethylene epoxidation. Physical Chemistry Chemical Physics 17 (38), S. 25073 - 25089 (2015)

Sarmiento-Pérez, R.; Botti, S.; Schnohr, C. S.; Lauermann, I.; Rubio, A.; Johnson, B.: Local versus global electronic properties of chalcopyrite alloys: X-ray absorption spectroscopy and ab initio calculations. Journal of Applied Physics 116 (9), 093703 (2014)

Greiner, M.; Rocha, T.; Johnson, B.; Klyushin, A.; Knop-Gericke, A.; Schlögl, R.: The Oxidation of Rhenium and Identification of Rhenium Oxides During Catalytic Partial Oxidation of Ethylene: An In-Situ XPS Study. Zeitschrift für physikalische Chemie 228 (4-5), S. 521 - 541 (2014)

Guiet, A.; Reier, T.; Heidary, N.; Felkel, D.; Johnson, B.; Vainio, U.; Schlaad, H.; Aksu, Y.; Driess, M.; Strasser, P. et al.; Thomas, A.; Polte, J.; Fischer, A.: A One-Pot Approach to Mesoporous Metal Oxide Ultrathin Film Electrodes Bearing One Metal Nanoparticle per Pore with Enhanced Electrocatalytic Properties. Chemistry of Materials 25 (23), S. 4645 - 4652 (2013)

Johnson, B.; Girgsdies, F.; Weinberg, G.; Rosenthal, D.; Knop-Gericke, A.; Schlögl, R.; Reier, T.; Strasser, P.: Suitability of Simplified (Ir,Ti)O_x Films for Characterization during Electrocatalytic Oxygen Evolution Reaction. The Journal of Physical Chemistry C 117 (48), S. 25443 - 25450 (2013)

Johnson, B.; Klaer, J.; Fischer, C.-H.; Lauermann, I.: Depth profiling of a CdS buffer layer on CuInS₂ measured with X-ray photoelectron spectroscopy during removal by HCl etching. Thin solid films 520 (7), S. 2829 - 2832 (2012)