Publications of Benjamin Johnson

Journal Article (8)

2016
Journal Article
Johnson, Benjamin, Ranjan Chinmoy, Mark Greiner, Rosa Arrigo, Manfred Erwin Schuster, Britta Höpfner, Mihaela Gorgoi, Iver Lauermann, Marc Georg Willinger, Axel Knop-Gericke and Robert Schlögl: Characterization of Platinum and Iridium Oxyhydrate Surface Layers from Platinum and Iridium Foils.
Journal Article
Strempel, Verena E., Daniel Löffler, Jutta Kröhnert, Katarzyna Skorupska, Benjamin Johnson, Raoul Naumann d’Alnoncourt, Matthias Driess and Frank Rosowski: Enhancing of catalytic properties of vanadia via surface doping with phosphorus using atomic layer deposition.
2015
Journal Article
Greiner, Mark, Travis Jones, Benjamin Johnson, Tulio Rocha, Zhu-Jun Wang, Marc Armbrüster, Marc Georg Willinger, Axel Knop-Gericke and Robert Schlögl: The oxidation of copper catalysts during ethylene epoxidation.
2014
Journal Article
Greiner, Mark, Tulio Rocha, Benjamin Johnson, Alexander Klyushin, Axel Knop-Gericke and Robert Schlögl: The Oxidation of Rhenium and Identification of Rhenium Oxides During Catalytic Partial Oxidation of Ethylene: An In-Situ XPS Study.
Journal Article
Sarmiento-Pérez, Rafael, Silvana Botti, Claudia S. Schnohr, Iver Lauermann, Angel Rubio and Benjamin Johnson: Local versus global electronic properties of chalcopyrite alloys: X-ray absorption spectroscopy and ab initio calculations.
2013
Journal Article
Guiet, Amandine, Tobias Reier, Nina Heidary, Diana Felkel, Benjamin Johnson, Ulla Vainio, Helmut Schlaad, Yilmaz Aksu, Matthias Driess, Peter Strasser, Arne Thomas, Jörg Polte and Anna Fischer: A One-Pot Approach to Mesoporous Metal Oxide Ultrathin Film Electrodes Bearing One Metal Nanoparticle per Pore with Enhanced Electrocatalytic Properties.
Journal Article
Johnson, Benjamin, Frank Girgsdies, Gisela Weinberg, Dirk Rosenthal, Axel Knop-Gericke, Robert Schlögl, T. Reier and P. Strasser: Suitability of Simplified (Ir,Ti)Ox Films for Characterization during Electrocatalytic Oxygen Evolution Reaction.
2012
Journal Article
Johnson, Benjamin, Joachim Klaer, Christian-Herbert Fischer and Iver Lauermann: Depth profiling of a CdS buffer layer on CuInS2 measured with X-ray photoelectron spectroscopy during removal by HCl etching.
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