Publications of Bodo Richter

Richter, B.; Kuhlenbeck, H.; Freund, H.-J.; Bagus, P. S.: Cluster core-level binding-energy shifts: the role of lattice strain. Physical Review Letters 93 (02), pp. 026805–1 - 026805–4 (2004)

Dupuis, A.-C.; Abu Al-Haija, M.; Richter, B.; Kuhlenbeck, H.; Freund, H.-J.: V₂O₃(0001) on Au(111) and W(110): growth, termination and electronic structure. Surface Science 539 (1-3), pp. 99 - 112 (2003)

Shaikhutdinov, S.; Heemeier, M.; Hoffmann, J.; Meusel, I.; Richter, B.; Bäumer, M.; Kuhlenbeck, H.; Libuda, J.; Freund, H.-J.; Oldman, R. J. et al.; Jackson, S. D.; Konvicka, C.; Schmid, M.; Varga, P.: Interaction of oxygen with palladium deposited on a thin alumina film. Surface Science 501 (3), pp. 270 - 281 (2002)

Schmidt, T.; Groh, U.; Fink, R.; Umbach, E.; Schaff, O.; Engel, W.; Richter, B.; Kuhlenbeck, H.; Schlögl, R.; Freund, H.-J. et al.; Bradshaw, A. M.; Preikszas, D.; Hartel, P.; Spehr, R.; Rose, H.; Lilienkamp, G.; Bauer, E.; Benner, G.: XPEEM with Energy-Filtering: Advantages and First Results from the SMART Project. Surface Review and Letters 9 (1), pp. 223 - 232 (2002)

Tepper, B.; Richter, B.; Dupuis, A.-C.; Kuhlenbeck, H.; Hucho, C.; Schilbe, P.; Yarmo, M. A. b.; Freund, H.-J.: Adsorption of molecular and atomic hydrogen on vacuum-cleaved V₂O₅(001). Surface science 496 (1-2), pp. 64 - 72 (2002)

Schroeder, T.; Adelt, M.; Richter, B.; Naschitzki, M.; Bäumer, M.; Freund, H.-J.: Growth of well-ordered silicon dioxide films on Mo(112). Microelectronics Reliability 40 (4-5), pp. 841 - 844 (2000)

Schroeder, T.; Adelt, M.; Richter, B.; Naschitzki, M.; Bäumer, M.; Freund, H.-J.: Epitaxial growth of SiO₂ on Mo(112). Surface Review and Letters 7 (1-2), pp. 7 - 14 (2000)

Richter, B.: Elektronenspektroskopische Untersuchungen an reinen und metallbelegten Oxidoberflächen mit Synchrotronstrahlung. Dissertation, Humboldt-Universität zu Berlin, Berlin (2002)