Publications of Bodo Richter

Richter, B., H. Kuhlenbeck, H.-J. Freund and P.S. Bagus: Cluster core-level binding-energy shifts: the role of lattice strain. Physical Review Letters 93 (02), 026805–1-026805–4 (2004).

Dupuis, A.-C., M. Abu Al-Haija, B. Richter, H. Kuhlenbeck and H.-J. Freund: V₂O₃(0001) on Au(111) and W(110): growth, termination and electronic structure. Surface Science 539 (1-3), 99–112 (2003).

Shaikhutdinov, S., M. Heemeier, J. Hoffmann, I. Meusel, B. Richter, M. Bäumer, H. Kuhlenbeck, J. Libuda, H.-J. Freund, R.J. Oldman, S.D. Jackson, C. Konvicka, M. Schmid and P. Varga: Interaction of oxygen with palladium deposited on a thin alumina film. Surface Science 501 (3), 270–281 (2002).

Schmidt, T., U. Groh, R. Fink, E. Umbach, O. Schaff, W. Engel, B. Richter, H. Kuhlenbeck, R. Schlögl, H.-J. Freund, A.M. Bradshaw, D. Preikszas, P. Hartel, R. Spehr, H. Rose, G. Lilienkamp, E. Bauer and G. Benner: XPEEM with Energy-Filtering: Advantages and First Results from the SMART Project. Surface Review and Letters 9 (1), 223–232 (2002).

Tepper, B., B. Richter, A.-C. Dupuis, H. Kuhlenbeck, C. Hucho, P. Schilbe, M.A.bin Yarmo and H.-J. Freund: Adsorption of molecular and atomic hydrogen on vacuum-cleaved V₂O₅(001). Surface science 496 (1-2), 64–72 (2002).

Schroeder, T., M. Adelt, B. Richter, M. Naschitzki, M. Bäumer and H.-J. Freund: Growth of well-ordered silicon dioxide films on Mo(112). Microelectronics Reliability 40 (4-5), 841–844 (2000).

Schroeder, T., M. Adelt, B. Richter, M. Naschitzki, M. Bäumer and H.-J. Freund: Epitaxial growth of SiO₂ on Mo(112). Surface Review and Letters 7 (1-2), 7–14 (2000).

Richter, B.: Elektronenspektroskopische Untersuchungen an reinen und metallbelegten Oxidoberflächen mit Synchrotronstrahlung. Humboldt-Universität zu Berlin Berlin