Publications of Wilfried Engel

Griffith, O. H.; Engel, W.: Historical perspective and current trends in emission microscopy, mirror electron microscopy and low-energy electron microscopy: An introduction to the proceedings of the second international symposium and workshop on emission microscopy and related techniques. Ultramicroscopy 36 (1-3), pp. 1 - 28 (1991)

Rowley, P. N.; Brydson, R.; Little, J.; Saunders , S. R. J.; Sauer, H.; Engel, W.: The effects of boron additions on the oxidation of Fe-Cr alloys in high-temperature steam: Analytical results and mechanisms. Oxidation of Metals 35 (5/6), pp. 375 - 395 (1991)

Jakubith, S.; Rotermund, H.-H.; Engel, W.; Oertzen, A. v.; Ertl, G.: Spatiotemporal concentration patterns in a surface reaction: Propagating and standing waves, rotating spirals, and turbulence. Physical Review Letters 65 (24), pp. 3013 - 3016 (1990)

Mundschau, M. V.; Kordesch, M. E.; Rausenberger, B.; Engel, W.; Bradshaw, A. M.; Zeitler, E.: Real-time observation of the nucleation and propagation of reaction fronts on surfaces using photoemission electron microscopy. Surface Science 227 (3), pp. 246 - 260 (1990)

Rotermund, H.-H.; Engel, W.; Kordesch, M.; Ertl, G.: Imaging of spatio-temporal pattern evolution during carbon monoxide oxidation on platinum. Nature 343, pp. 355 - 357 (1990)

Engel, W.; Degenhardt, R.; Bradshaw, A. M.; Erlebach, W.; Ihmann, K.; Kuhlenbeck, H.; Wichtendahl, R.; Freund, H.-J.; Schlögl, R.; Preikszas, D. et al.; Rose, H.; Spehr, R.; Hartel, P.; Lilienkamp, G.; Schmidt, T.; Bauer, E.; Benner, G.; Fink, R.; Weiss, M. R.; Umbach, E.: Concept and design of the SMART spectromicroscope at BESSY II. In: X-Ray Microscopy and Spectromicroscopy, pp. 271 - 282 (Eds. Thieme, J.; Schmahl, G.; Rudolph, D.; Umbach, E.). Springer, Berlin (1998)

Engel, W.; Sauer, H.: Electron energy-loss near-edge structures as a probe of solids. In: Electron Microscopy 1990: Proceedings of the XIIth International Congress for Electron Microscopy, Vol. 2, pp. 70 - 71 (Eds. Peachey, L.D.; Williams, D. B.). 12th International Congress for Electron Microscopy, Seattle, Washington, USA, August 12, 1990 - August 18, 1990. San Francisco Press, San Francisco, CA (1990)