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Book Chapter (431)

9141.
Book Chapter
Gumhalter, B.; Hermann, K.; Wandelt, K.: Lateral Surface Stark Effect in Chemisorbed Molecules. In: Selected Studies of Adsorption on Metal and Semiconductor Surfaces, pp. 291 - 297. Scientific Series of the International Bureau, Forschungszentrum Jülich GmbH (1990)
9142.
Book Chapter
Hasselbrink, E.; Nettesheim, S.; Wolf, M.; Cassuto; Ertl, G.: Substrate Mediated Photodissociation of NO2/N2O4 Adsorbed on Pd(111). In: Desorption Induced by Electronic Transitions DIET IV: Proceedings of the Fourth International Workshop, Gloggnitz, Austria, October 2–4, 1989, Vol. 19, pp. 75 - 79 (Eds. Betz, G.; Varga, P.). Springer, Berlin (1990)
9143.
Book Chapter
Kreuzer, H. J.: Surface Physics and Chemistry in High Electric Fields. In: Chemistry and Physics of Solid Surfaces VIII, pp. 133 - 158 (Eds. Vanselow, R.; Howe, R.). Springer, Berlin, Heidelberg (1990)
9144.
Book Chapter
Zemlin, F.: Cryoelectron Microscopy of Protein Crystals. Some Remarks on the Methodology. In: Electron Crystallography of Organic Molecules, pp. 305 - 308 (Eds. Fryer, J. R.; Dorset, D. L.). Springer, Dordrecht (1990)
9145.
Book Chapter
Scheffler, M.; Scherz, U.: Resonant Raman scattering at point defects in GaAs. In: Defects in Semiconductors, pp. 353 - 358 (Ed. von Bardeleben, H.J.). Trans Tech Publications Ltd., Switzerland (1986)
9146.
Book Chapter
Weinert, C. M.; Scheffler, M.: Chalcogen and vacancy pairs in silicon: Electronic structure and stabilities. In: Defects in Semiconductors, pp. 25 - 30 (Ed. von Bardeleben, H.J.). Trans Tech Publications Ltd., Switzerland (1986)
9147.
Book Chapter
Scheffler, M.; Bradshaw, A. M.: The electronic structure of adsorbed layers. In: Adsorption at Solid Surfaces, pp. 165 - 257. Elsevier, Amsterdam (1983)
9148.
Book Chapter
Scheffler, M.: Electronic structure of simple deep-level defects in semiconductors. In: Festkörperprobleme, pp. 115 - 148 (Ed. Grosse, P.). Vieweg, Braunschweig (1982)
9149.
Book Chapter
Ertl, G.; Gerischer, H.: Semiconductor Surfaces. In: Solid State, Vol. 10, pp. 371 - 433 (Eds. Eyring, H.; Henderson, D.; Jost, W.). Academic Press, New York, (1970)

Proceedings (4)

9150.
Proceedings
Nonlinear terahertz spectroscopy of magnetically ordered solids. 34th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2009), Busan, Korea, September 21, 2009 - September 25, 2009. (2009), 2 pp.
9151.
Proceedings
Schaefer, J. A.; Schlögl, R.; Stutzmann, M. (Eds.): Nitrogen in Solids and at Solid Surfaces: Present Status and Future Trends (Physica Status Solidi A, 177). Proceedings of the 216. WE-Heraeus Seminar, Ilmenau, Germany, May 30, 1999 - June 02, 1999. (2000), 1-171 p.
9152.
Proceedings
Scheffler, M.; Zimmermann, R. (Eds.): 23rd International Conference on the Physics of Semiconductors: Berlin, Germany, July 21 - 26, 1996. 23rd International Conference on the Physics of Semiconductors, Berlin, Germany, July 21, 1996 - July 26, 1996. World Scientific, Singapore (1996), 3450 pp.
9153.
Proceedings
Femtosecond laser-induced processes: ultrafast dynamics and reaction pathways for O2/Pd(111) (Proceedings Volume 2125, Laser Techniques for Surface Science, 2125). OE/LASE '94, Los Angeles, CA, United States, January 23, 1994 - January 29, 1994. (1994), 9 pp.

Conference Paper (279)

9154.
Conference Paper
Hetaba, W.; Stotz, E.; Ramermann, D.; Wolf, E. H.; Kujawa, S.; Schlögl, R.; Lunkenbein, T.: Glovebox coupled TEM - a new method for versatile investigations of air-sensitive samples. 17th European Microscopy Congress, EMC 2024, Copenhagen, Denmark, August 25, 2024 - August 30, 2024. BIO Web of Conferences 129, 03008, (2024)
9155.
Conference Paper
Chee, S. W.; Yoon, A.; Fu, S.-Y.; Roldan Cuenya, B.: Tracking Morphology and Chemical State of Electrocatalysts during Reaction through Correlated Electron Microscopy, X-ray Microscopy and X-ray Absorption Spectroscopy Experiments. Microscopy and Microanalysis 30 (Suppl. 1), ozae044.228, (2024)
9156.
Conference Paper
Frenzel, M.; Minakova, O.; Urban, J.; Nest, L.; Kampfrath, T.; Spencer, M. S.; Maehrlein, S. F.: THz helicity mapping towards coherent control of chiral low-energy excitations. In: Proceedings Volume 12994, Terahertz Photonics III, Vol. 12994, 1299401 (Eds. Jarrahi, M.; Preu, S.; Turchinovich, D.). SPIE Photonics Europe 2024, Strasbourg, Fance, April 07, 2024 - April 12, 2024. SPIE, Bellingham, Washington (2024)
9157.
Conference Paper
Jones, T.: Electro-Catalysis for H2O Oxidation and Chlorine Evolution. In: High Performance Computing in Science and Engineering '22: Transactions of the High Performance Computing Center, Stuttgart (HLRS) 2022, pp. 89 - 100 (Ed. Nagel, W. E.). International Conference on High Performance Computing in Science and Engineering, HPCSE 2022, Karolinka, Czech Republic, May 16, 2022 - May 19, 2024. Springer, Cham (2024)
9158.
Conference Paper
Salazar Gómez, J.I.; Sojka, M.; Klucken, C.; Schlögl, R.; Ruland, H.: From metallurgical gases towards green hydrogen. PTR-TOF-MS - a remarkable companion of the energy transition and defossilization. In: 9th International Conference on Proton Transfer Reaction Mass Spectrometry and its Applications, pp. 135 - 138 (Eds. Hansel, A.; Dunkl, J.). 9th International PTR-MS Conference, Seefeld, Austria, June 26, 2024 - June 29, 2024. Innsbruck University press, Innsbruck (2024)
9159.
Conference Paper
Frenzel, M.; Nest, L.; Urban, J.; Spencer, M. S.; Maehrlein, S. F.: Measuring the Electro-optic Response of Quartz for Accurate Sampling of Intense THz Fields. In: 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2023), 10299107. 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2023), Montreal, QC, Canada, September 17, 2023 - September 22, 2023. IEEE (2023)
9160.
Conference Paper
Kampfrath, T.: Terahertz spintronics: New insights into magnetic phenomena and their application in terahertz photonics. In: 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2023), 10299147. 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2023), Montreal, QC, Canada, September 17, 2023 - September 22, 2023. IEEE (2023)
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