Angle-resolved photoemission spectroscopy (ARPES) is often considered the best way to experimentally determine the ground-state electronic structure of materials. However, although applying ARPES to short-lived excited states via the pump/probe method (tr-ARPES) demands orders of magnitude more data than ground-state ARPES studies, measurements have been forced to work with orders of magnitude lower data rates due to the limits imposed by the repetition rate of available short-pulse extreme-ultraviolet (XUV) light sources and the collection efficiency of photoelectron analyzers.
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