Speaker: Dr. Jo Onoda

Surface states conduction measurements by two-probe scanning tunneling microscopy with Ohmic contact

  • PC Department Online Seminar
  • Date: Jan 10, 2022
  • Time: 04:00 PM (Local Time Germany)
  • Speaker: Dr. Jo Onoda
  • University of Alberta, Canada
Relentless downscaling of conventional electronic devices demands continuous improvement in characterization of microscopic surface electronic properties. Moreover, in the pursuit of more exploratory device concepts such as atomic-scale logic gates [1] and memories [2] composed of dangling bonds on hydrogen-terminated Si surfaces there is great need for characterization of extremely small one- and two-dimensional structures. [more]
Go to Editor View