Operando SXRD/XAS studies of CoOx epitaxial thin films for OER electrocatalysis
- Date: Sep 19, 2022
- Time: 02:00 PM (Local Time Germany)
- Speaker: Philippe Allongue
- Directeur de Recherche at CNRS, Institut Polytechnique de Paris, 91128 Palaiseau, France.
- Location: Building M, Richard-Willstätter-Haus, Faradayweg 10, 14195 Berlin
- Room: Seminar Room
- Host: Interface Science Department
- Contact: roldan@fhi-berlin.mpg.de
We use epitaxial CoOOH(001)
and Co3O4(111) thin films (10-30 nm) with well-defined
structure and morphology, which are grown by electrodeposition on Au (111). As operando characterizations, we used coupled
surface x-ray diffraction (SXRD) / optical reflectivity and coupled operando SXRD / x-ray absorption
spectroscopy (XAS). Recent data will be presented and it will be shown that they
yield new insights into important questions such as the structure of the oxide
surface in OER conditions, the number of atomic sites involved in the OER and the cobalt oxidation state (OS) at the surface in OER conditions.
[1] Finn Reikowski et al., Operando Surface X-ray Diffraction Studies of Structurally-defined Co3O4 and CoOOH Thin Films during Oxygen Evolution, ACS Catalysis, 9, 3811 (2019), https://doi.org/10.1021/acscatal.8b04823
[2] Tim Wiegmann et al., Operando identification of the reversible skin layer on Co3O4 as a three-dimensional reaction zone for oxygen evolution, ACS Catal., https://doi.org/10.1021/acscatal.1c05169