Publications of Markus Heyde

Lichtenstein, L., M. Heyde and H.-J. Freund: Atomic Arrangement in Two-Dimensional Silica: From Crystalline to Vitreous Structures. Journal of Physical Chemistry C 116 (38), 20426–20432 (2012).

Lichtenstein, L., M. Heyde and H.-J. Freund: Crystalline-Vitreous Interface in Two Dimensional Silica. Physical Review Letters 109 (10), 106101 (2012).

Lichtenstein, L., M. Heyde, S. Ulrich, N. Nilius and H.-J. Freund: Probing the properties of metal–oxide interfaces: silica films on Mo and Ru supports. Journal of Physics: Condensed Matter 24 (35), 354010 (2012).

Simon, G.H., M. Heyde and H.-J. Freund: Imaging and manipulation of adatoms on an alumina surface by noncontact atomic force microscopy. Journal of Physics: Condensed Matter 24 (8), 084007 (2012).

Yang, B., W. Kaden, X. Yu, A. Boscoboinik, Y. Martynova, L. Lichtenstein, M. Heyde, M. Sterrer, R. Włodarczyk, M. Sierka, J. Sauer, S.K. Shaikhutdinov and H.-J. Freund: Thin silica films on Ru(0001): monolayer, bilayer and three-dimensional networks of [SiO₄] tetrahedra. Physical Chemistry Chemical Physics 14 (32), 11344–11351 (2012).

König, T., L. Heinke, G.H. Simon and M. Heyde: Three-dimensional electrostatic interactions in dynamic force microscopy: Experiment and theory. Physical Review B 83, 195435–1-195435–6 (2011).

König, T., G.H. Simon, L. Heinke, L. Lichtenstein and M. Heyde: Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy. Beilstein Journal of Nanotechnology 2, 1–14 (2011).

Simon, G.H., T. König, L. Heinke, L. Lichtenstein, M. Heyde and H.-J. Freund: Atomic structure of surface defects in alumina studied by dynamic force microscopy: strain-relief-, translation- and reflection-related boundaries, including their junctions. New Journal of Physics 13 (12), 123028 (2011).

Heinke, L., L. Lichtenstein, G.H. Simon, T. König, M. Heyde and H.-J. Freund: Local work function differences at line defects in aluminium oxide on NiAl(110). ChemPhysChem 11 (10), 2085–2087 (2010).

Heinke, L., L. Lichtenstein, G.H. Simon, T. König, M. Heyde and H.-J. Freund: Structure and electronic properties of step edges in the aluminium oxide film on NiAl(110). Physical Review B 82, 075430–1-075430–6 (2010).

König, T., G.H. Simon, U. Martinez, L. Giordano, G. Paccioni, M. Heyde and H.-J. Freund: Direct measurement of the attractive interaction forces on F⁰ color centers on MgO(001) by dynamic force microscopy. ACS Nano 4 (5), 2510–2514 (2010).

Löffler, D., J. Uhlrich, M. Baron, B. Yang, X. Yu, L. Lichtenstein, L. Heinke, C. Büchner, M. Heyde, S. Shaikhutdinov, H.-J. Freund, R. Włodarczyk, M. Sierka and J. Sauer: Growth and structure of crystalline silica sheet on Ru(0001). Physical Review Letters 105 (14), 146104 (2010).

Simon, G.H., T. König, H.-P. Rust, M.V. Ganduglia-Pirovano, J. Sauer, M. Heyde and H.-J. Freund: Imaging of individual adatoms on oxide surfaces by dynamic force microscopy. Physical Review B 81 (7), 073411–1-073411–4 (2010).

König, T., G.H. Simon, H.-P. Rust and M. Heyde: Work function measurements of thin oxide films on metals-MgO on Ag(001). The Journal of Physical Chemistry C 113 (26), 11301–11305 (2009).

König, T., G.H. Simon, H.-P. Rust and M. Heyde: Atomic resolution on a metal single crystal with dynamic force microscopy. Applied Physics Letters 95 (8), 083116–1-083116–3 (2009).

König, T., G.H. Simon, H.-P. Rust, G. Pacchioni, M. Heyde and H.-J. Freund: Measuring the charge state of point defects on MgO/Ag(001). Journal of the American Chemical Society 131 (46), 17544–17545 (2009).

Rust, H.-P., T. König, G.H. Simon, M. Nowicki, V. Simic-Milosevic, G. Thielsch, M. Heyde and H.-J. Freund: A portable microevaporator for low temperature single atom studies by scanning tunneling and dynamic force microscopy. Review of Scientific Instruments 80 (11), 113705–1-113705–4 (2009).

Simon, G.H., T. König, H.-P. Rust, M. Heyde and H.-J. Freund: Atomic structure of the ultrathin alumina on NiAl(110) and its antiphase domain boundaries as seen by frequency modulation dynamic force microscopy. New Journal of Physics 11, 093009–1-093009–16 (2009).

Albers, B., M. Liebmann, T.C. Schwendemann, M.Z. Baykara, M. Heyde, M. Salmeron, E.I. Altman and U.D. Schwarz: Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy. Review of Scientific Instruments 79 (3), 033704–1-033704–9 (2008).

Kinoshita, K., G.H. Simon, T. König, M. Heyde, H.-J. Freund, Y. Nakagawa, S. Suzuki, W.-J. Chun, S.T. Oyama, S. Otani and K. Asakura: A scanning tunneling microscopy observation of (√3x√3)R30° reconstructed Ni₂P(0001). Japanese Journal of Applied Physics 47 (7), 6088–6091 (2008).