Publications of Matthias Scheffler

Scheffler, M.; Bernholc, J.; Lipari, N. O.; Pantelides, S. T.: Electronic structure and identification of deep defects in GaP. Physical Review B 29, pp. 3269 - 3282 (1984)

Pantelides, S. T.; Ivanov, I.; Scheffler, M.; Vigneron, J. P.: Multivacancies, interstitials, and self-interstitial migration in Si. Physica B 116, pp. 18 - 27 (1983)

Vigneron, J. P.; Scheffler, M.; Pantelides, S. T.: Electronic structure of self-interstitials and sp-bonded interstitial impurities in semiconductors. Physica B/C 117/118, pp. 137 - 139 (1983)

Bernholc, J.; Lipari, N. O.; Pantelides, S. T.; Scheffler, M.: Electronic structure of deep sp-bonded impurities in silicon. Physical Review B 26 (10), pp. 5706 - 5715 (1982)

Scheffler, M.; Vigneron, J. P.; Bachelet, G. B.: Tractable approach for calculating lattice distortions around simple defects in semiconductors: Application to the single donor Ge in GaP. Physical Review Letters 49, pp. 1765 - 1768 (1982)

Schirmer, O.; Scheffler, M.: Determination of deep donor binding energies from their g-values. Journal of Physics C: Solid State Physics 15, pp. L645 - L650 (1982)

Scheffler, M.; Pantelides, S. T.; Lipari, N. O.; Bernholc, J.: Identification and properties of native defects in GaP. Physical Review Letters 47, p. 413 (1981)

Hora, R.; Scheffler, M.: Photoemission and the electronic structure of a c(2x2) sulfur adsorbate-layer on Pd. Proceedings of the 4th International Conference on Solid Surfaces and the 3rd European Conf. on Surf. Sci. (1980)

Scheffler, M.; Horn, K.; Bradshaw, A. M.; Kambe, K.: Angular-resolved photoemission from physisorbed xenon. Surface science 80, pp. 69 - 77 (1979)

Bradshaw, A. M.; Scheffler, M.: Lateral interactions in adsorbed layers. J. Vac. Sci. Tech. 16, pp. 447 - 454 (1979)

Hoffmann, P.; Muschwitz, C. v.; Horn, K.; Jacobi, K.; Bradshaw, A. M.; Kambe, K.; Scheffler, M.: Angular-resolved photoemission from an ordered oxygen overlayer on aluminium (111). Surface Science 89 (1-3), p. 327 (1979)

Kambe, K.; Scheffler, M.: Theory of photoexcitation of adsorbates. Surface science 89, p. 262 (1979)

Scheffler, M.: The influence of lateral interactions on the vibrational spectrum of adsorbed CO. Surface Science 81, pp. 562 - 570 (1979)

Horn, K.; Scheffler, M.; Bradshaw, A. M.: Photoemission from physisorbed xenon: Evidence for lateral interactions. Physical Review Letters 41 (12), pp. 822 - 825 (1978)

Scheffler, M.; Horn, K.; Bradshaw, A. M.; Kambe, K.: Photoemission from physisorbed xenon. Nederlands Tijdschrift voor Vacuumtechniek 10 (2/3/4), p. 85 (1978)

Scheffler, M.; Kambe, K.; Forstmann, F.: Angle-resolved photoemission from adsorbates: Theoretical considerations of polarization effects and symmetry. Solid State Communications 25, pp. 93 - 99 (1978)

Jacobi, K.; Scheffler, M.; Kambe, K.; Forstmann, F.: Angle-resolved photoemission from the p(2x2) oxygen overlayer on Ni(001): Measurements and calculations. Solid State Communications 22, p. 17 (1977)

Jacobi, K.; Scheffler, M.; Kambe, K.; Forstmann, F.: Angle-resolved photoemission of the oxygen overlayer on Ni(001): Part 2 (Experiments). Proc. 7th Int. Vac. Congr. & 3rd Conf. Sol. Surf., p. 2227 (1977)

Schweitzer, L.; Scheffler, M.: Electronic properties of strained bonds in amorphous silicon: The origin of the band-tail states.

Elsässer, T.; Grötschel, M.; Scheffler, M.; Ullrich, J. H.; Blanckenburg, F. v.: Open Research Data in Naturwissenschaften und Mathematik: Empfehlungen der mathematisch-naturwissenschaftlichen Klasse der BBAW. Berlin-Brandenburgischen Akademie der Wissenschaften, Berlin (2022), 11 pp.